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Anomalous X-Ray Scattering for Material Characterization : Atomic-Scale Structure Determination

Author: Yoshio Waseda
Publisher: Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg : Springer e-books, 2002.
Series: Springer tracts in modern physics (Internet)
Edition/Format:   Computer file : Document : EnglishView all editions and formats
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Material Type: Document
Document Type: Computer File
All Authors / Contributors: Yoshio Waseda
ISBN: 9783540460084 354046008X
OCLC Number: 801000488
Description: 1 online resource.
Details: Nécessite un lecteur de fichier PDF.
Series Title: Springer tracts in modern physics (Internet)
Responsibility: by Yoshio Waseda.

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