skip to content
Applied crystallography : proceedings of the XVth conference, Cieszyn, Poland, August 9-12, 1992 Preview this item
ClosePreview this item
Checking...

Applied crystallography : proceedings of the XVth conference, Cieszyn, Poland, August 9-12, 1992

Author: Henryk Morawiec; Danuta Stróz̊
Publisher: Singapore ; River Edge, NJ : World Scientific, [1993] ©1993
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:
The proceedings of the XVth Conference on Applied Crystallography held in Cieszyn, Poland in August 1992 concentrated on two main fields. In the first field, special attention was paid to phase transformation in metal. In the second field, the papers dealt with methods such as quantitative phase identification, synchrotron technique and diffraction line analysis. A number of papers on computerization of experimental  Read more...
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Electronic books
Conference papers and proceedings
Cieszyn (1992)
Congresses
Additional Physical Format: Print version:
Conference on Applied Crystallography (15th : 1992 : Cieszyn, Poland).
Applied crystallography
(OCoLC)28841174
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Henryk Morawiec; Danuta Stróz̊
ISBN: 9789814535878 9814535877
OCLC Number: 892910975
Description: 1 online resource (xii, 281 pages) : illustrations
Contents: Foreword; Contents; The International Centre for Diffraction Data and its Future Development; The Rietveld Method --
A Historical Perspective; 1. Introduction; 2. Previous Efforts; 3. The Use of Profile Intensities; 4. The Acceptance of the Method; 5. Conclusion; 6. References; Real Structure in Quantitative Powder Diffraction Phase Analysis; Introduction; Quantitative Powder Diffraction Phase Analysis; Self-Calibration Techniques; Error Analysis; Limitations of the Self-Calibrating Method; Conclusion; References; Neutron Focusing Optics in Applied Crystallography; 1. Introduction. 2. Short Wavelength Monochromators3. Double Bent Crystal Diffractometer for SANS Studies; 4. Triple Axis Setup for Residual Stress Measurements; References; The Crystal Strucutres of Oxygen Deficient Rare Earth Oxides; References; Short-Range Order in Layer-Structured Ba1-xSrxBi2Nb2O9 Ferroelectrics; 1. Introduction; 2. Experiment and Data Analysis; 3. Results; Sr-K and Ba-LIII EXAFS; Bi-LIII EXAFS; 4. Conclusion; Bismuth-oxide layers; NbO6 Octahedra; Acknowledgement; References; Radial Distribution Function as a Tool of Structural Studies on Noncrystalline Materials; Introduction. Theoretical OutlineExperimental Diffraction Techniques; Computation of Radial Distribution Function and Methods of Interpretation; Summary; References; Determination of Radial Distribution Function (RDF) of Electrodeposited Cu-Cd Alloys After Annealing; Introduction; Investigated Materials and Method; Results and Discussion; References; Spheres Packing as a Factor Describing the Local Environment and Structure Stability; References; X-Ray Stress Measurement of Samples Combined with Diffraction Line Analysis; Abstract; Method of Investigation.
Responsibility: edited by Henryk Morawiec & Danuta Stróz̊.

Abstract:

These papers cover two main fields: 1) real structure of materials and 2) research methods and equipment. In the first field, special attention is paid to phase transformation in metals. In the  Read more...

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/892910975> # Applied crystallography : proceedings of the XVth conference, Cieszyn, Poland, August 9-12, 1992
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
   library:oclcnum "892910975" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/si> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/3863816915#Topic/crystallography> ; # Crystallography
   schema:about <http://dewey.info/class/548/e22/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/3863816915#Topic/x_rays_diffraction> ; # X-rays--Diffraction
   schema:about <http://experiment.worldcat.org/entity/work/data/3863816915#Topic/science_physics_crystallography> ; # SCIENCE--Physics--Crystallography
   schema:about <http://experiment.worldcat.org/entity/work/data/3863816915#Topic/cristalografia> ; # Cristalografia
   schema:about <http://experiment.worldcat.org/entity/work/data/3863816915#Topic/kongress> ; # Kongress
   schema:about <http://experiment.worldcat.org/entity/work/data/3863816915#Topic/kristallographie> ; # Kristallographie
   schema:bookFormat schema:EBook ;
   schema:contributor <http://experiment.worldcat.org/entity/work/data/3863816915#Person/morawiec_henryk> ; # Henryk Morawiec
   schema:contributor <http://experiment.worldcat.org/entity/work/data/3863816915#Person/stroz_danuta> ; # Danuta Stróz̊
   schema:creator <http://experiment.worldcat.org/entity/work/data/3863816915#Meeting/conference_on_applied_crystallography_15th_1992_cieszyn_poland> ; # Conference on Applied Crystallography (15th : 1992 : Cieszyn, Poland)
   schema:datePublished "1993" ;
   schema:description "The proceedings of the XVth Conference on Applied Crystallography held in Cieszyn, Poland in August 1992 concentrated on two main fields. In the first field, special attention was paid to phase transformation in metal. In the second field, the papers dealt with methods such as quantitative phase identification, synchrotron technique and diffraction line analysis. A number of papers on computerization of experimental results, didactics and methodological problems are also included in this set of proceedings. Contents: The International Centre for Diffraction Data and Its Future Developments (J."@en ;
   schema:description "Foreword; Contents; The International Centre for Diffraction Data and its Future Development; The Rietveld Method -- A Historical Perspective; 1. Introduction; 2. Previous Efforts; 3. The Use of Profile Intensities; 4. The Acceptance of the Method; 5. Conclusion; 6. References; Real Structure in Quantitative Powder Diffraction Phase Analysis; Introduction; Quantitative Powder Diffraction Phase Analysis; Self-Calibration Techniques; Error Analysis; Limitations of the Self-Calibrating Method; Conclusion; References; Neutron Focusing Optics in Applied Crystallography; 1. Introduction." ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/3863816915> ;
   schema:genre "Electronic books"@en ;
   schema:genre "Cieszyn (1992)"@en ;
   schema:genre "Conference publication"@en ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/28841174> ;
   schema:name "Applied crystallography : proceedings of the XVth conference, Cieszyn, Poland, August 9-12, 1992"@en ;
   schema:productID "892910975" ;
   schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=862351> ;
   schema:url <http://www.myilibrary.com?id=653675> ;
   schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=1812593> ;
   schema:url <http://site.ebrary.com/id/10951433> ;
   schema:workExample <http://worldcat.org/isbn/9789814535878> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/892910975> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/3863816915#Meeting/conference_on_applied_crystallography_15th_1992_cieszyn_poland> # Conference on Applied Crystallography (15th : 1992 : Cieszyn, Poland)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/3863816915#Place/cieszyn_poland> ; # Cieszyn, Poland)
   schema:name "Conference on Applied Crystallography (15th : 1992 : Cieszyn, Poland)" ;
    .

<http://experiment.worldcat.org/entity/work/data/3863816915#Person/morawiec_henryk> # Henryk Morawiec
    a schema:Person ;
   schema:familyName "Morawiec" ;
   schema:givenName "Henryk" ;
   schema:name "Henryk Morawiec" ;
    .

<http://experiment.worldcat.org/entity/work/data/3863816915#Person/stroz_danuta> # Danuta Stróz̊
    a schema:Person ;
   schema:familyName "Stróz̊" ;
   schema:givenName "Danuta" ;
   schema:name "Danuta Stróz̊" ;
    .

<http://experiment.worldcat.org/entity/work/data/3863816915#Place/cieszyn_poland> # Cieszyn, Poland)
    a schema:Place ;
   schema:name "Cieszyn, Poland)" ;
    .

<http://experiment.worldcat.org/entity/work/data/3863816915#Topic/science_physics_crystallography> # SCIENCE--Physics--Crystallography
    a schema:Intangible ;
   schema:name "SCIENCE--Physics--Crystallography"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/3863816915#Topic/x_rays_diffraction> # X-rays--Diffraction
    a schema:Intangible ;
   schema:name "X-rays--Diffraction"@en ;
    .

<http://worldcat.org/isbn/9789814535878>
    a schema:ProductModel ;
   schema:isbn "9814535877" ;
   schema:isbn "9789814535878" ;
    .

<http://www.worldcat.org/oclc/28841174>
    a schema:CreativeWork ;
   rdfs:label "Applied crystallography" ;
   schema:description "Print version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/892910975> ; # Applied crystallography : proceedings of the XVth conference, Cieszyn, Poland, August 9-12, 1992
    .

<http://www.worldcat.org/title/-/oclc/892910975>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/892910975> ; # Applied crystallography : proceedings of the XVth conference, Cieszyn, Poland, August 9-12, 1992
   schema:dateModified "2017-12-24" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.