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Applied logistic regression

Author: David W Hosmer; Stanley Lemeshow
Publisher: New York : Wiley, ©1989.
Series: Wiley series in probability and mathematical statistics., Applied probability and statistics.
Edition/Format:   eBook : Document : EnglishView all editions and formats
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Hosmer, David W.
Applied logistic regression.
New York : Wiley, ©1989
(DLC) 89031893
(OCoLC)19514573
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: David W Hosmer; Stanley Lemeshow
ISBN: 0585362696 9780585362694
OCLC Number: 47010350
Notes: "A Wiley-Interscience publication."
Reproduction Notes: Electronic reproduction. [S.l.] : HathiTrust Digital Library, 2010. MiAaHDL
Description: 1 online resource (xiii, 307 pages).
Details: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Contents: 1. Introduction to the logistic regression model --
2. The multiple logistic regression model --
3. Interpretation of the coefficients of the logistic regression model --
4. Model-building strategies and methods for logistic regression --
5. Assessing the fit of the model --
6. Application of logistic regression with different sampling models --
7. Logistic regression for matched case-control studies --
8. Special topics.
Series Title: Wiley series in probability and mathematical statistics., Applied probability and statistics.
Responsibility: David W. Hosmer, Jr., Stanley Lemeshow.

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