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Applied reliability

Author: Paul A Tobias; David C Trindade
Publisher: New York : Van Nostrand Reinhold, ©1995.
Edition/Format:   Print book : English : 2nd edView all editions and formats
Database:WorldCat
Summary:

This reference on applied reliability focuses on the problems that engineers deal with every day. The second edition adds over 170 pages of material to the contents of the first edition. It includes  Read more...

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Document Type: Book
All Authors / Contributors: Paul A Tobias; David C Trindade
ISBN: 0442004699 9780442004699
OCLC Number: 31514423
Description: x, 421 p. : ill. ; 24 cm.
Contents: Preface Basic Descriptive Statistics Reliability Concepts The Exponential Distribution The Weibull Distribution The Normal and Lognormal Distributions Reliability Data Plotting Physical Acceleration Models System Models and Reliability Algorithms Quality Control in Reliability: Applications of the Binomial Distributions Repairable Systems I: Renewal Processes Repairable System II: Non-Renewal Processes A Survey of Other Topics in Reliability Answers to Selected Exercises Appendix: Percentiles of the chi-square Distribution References
Responsibility: Paul A. Tobias, David C. Trindade.
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