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Applied scanning probe methods III : characterization.

Author: Bharat Bhushan
Publisher: Berlin ; New York : Springer, ©2006.
Series: Nanoscience and technology.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.

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Document Type: Book
All Authors / Contributors: Bharat Bhushan
ISBN: 3540269096 9783540269090
OCLC Number: 70827941
Description: xliii, 378 pages ; 24 cm.
Contents: (Following Volume II.) --
12. Atomic force microscopy in nanomedicine --
13. Scanning probe microscopy: from living cells to the subatomic range --
14. Surface characterization and adhension and friction properties of hydrophobic leaf surfaces and nanopatterned polymers for superhydrophobic surfaces --
15. Probing macromolecular dynamics and the influence of finite size effects --
16. Investigation of organic supramolecules by scanning probe microscopy in ultra-high vacuum --
17. One- and two-dimensional systems: scanning tunneling microscopy and spectroscopy of organic and inorganic structures --
18. Scanning probe microscopy applied to ferroelectric materials --
19. Morphological and tribological characterization of rough surfaces by atomic force microscopy --
20. AFM applications for contact and wear simulation --
21. AFM applications for analysis of fullerene-like nanoparticles --
22. Scanning probe methods in the magnetic tape industry.
Series Title: Nanoscience and technology.

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