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Applied scanning probe methods XI : scanning probe microscopy techniques

Author: Bharat Bhushan; H Fuchs
Publisher: Berlin ; London : Springer, ©2009.
Series: Nanoscience and technology.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Applied scanning probe methods XI.
Berlin ; London : Springer, 2008
(OCoLC)241054756
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
OCLC Number: 310353447
Description: 1 online resource.
Contents: J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM --
E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation --
M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies --
M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science --
DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements --
L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip --
D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations --
M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Series Title: Nanoscience and technology.
Responsibility: edited by Bharat Bhushan, Harald Fuchs.
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Abstract:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  Read more...

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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the Read more...

 
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