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Applied scanning probe methods XI : scanning probe microscopy techniques Titelvorschau
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Applied scanning probe methods XI : scanning probe microscopy techniques

Verfasser/in: Bharat Bhushan; H Fuchs
Verlag: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
Serien: Nanoscience and technology.
Ausgabe/Format   E-Book : Dokument : EnglischAlle Ausgaben und Formate anzeigen
Datenbank:WorldCat
Zusammenfassung:
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  Weiterlesen…
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Gattung/Form: Electronic books
Physisches Format Print version:
Bhushan, Bharat.
Applied Scanning Probe Methods XI.
Berlin, Heidelberg : Springer Berlin Heidelberg, 2009
(OCoLC)241054756
Medientyp: Dokument, Internetquelle
Dokumenttyp: Internet-Ressource, Computer-Datei
Alle Autoren: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
OCLC-Nummer: 311303119
Beschreibung: 1 online resource.
Inhalt: J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM --
E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation --
M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies --
M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science --
DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements --
L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip --
D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations --
M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Serientitel: Nanoscience and technology.
Verfasserangabe: edited by Bharat Bhushan, Harald Fuchs.

Abstract:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  Weiterlesen…

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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the Weiterlesen…

 
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Primary Entity

<http://www.worldcat.org/oclc/311303119> # Applied scanning probe methods XI scanning probe microscopy techniques
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
    library:oclcnum "311303119" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/364540264#Place/berlin_heidelberg> ; # Berlin, Heidelberg
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
    schema:about <http://id.worldcat.org/fast/1054130> ; # Particles (Nuclear physics)
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/surfaces_and_interfaces_thin_films> ; # Surfaces and Interfaces, Thin Films
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/electronic_books> ; # Electronic books
    schema:about <http://id.worldcat.org/fast/1070588> ; # Polymers
    schema:about <http://id.worldcat.org/fast/1715687> ; # Physical organic chemistry
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/physical_chemistry> ; # Physical Chemistry
    schema:about <http://id.worldcat.org/fast/1139265> ; # Surfaces (Physics)
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/scanning_probe_microscopy_industrial_applications> ; # Scanning probe microscopy--Industrial applications
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/chemistry> ; # Chemistry
    schema:about <http://id.worldcat.org/fast/1032639> ; # Nanotechnology
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/solid_state_physics_and_spectroscopy> ; # Solid State Physics and Spectroscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/polymer_sciences> ; # Polymer Sciences
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/science_microscopes_&_microscopy> ; # SCIENCE--Microscopes & Microscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/scanning_probe_microscopy> ; # Scanning probe microscopy
    schema:about <http://dewey.info/class/502.82/e22/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/materials_microscopy> ; # Materials--Microscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/chimie> ; # Chimie
    schema:about <http://experiment.worldcat.org/entity/work/data/364540264#Topic/science_des_materiaux> ; # Science des matériaux
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/294988852> ; # Harald Fuchs
    schema:contributor <http://viaf.org/viaf/2544727> ; # Bharat Bhushan
    schema:datePublished "2009" ;
    schema:description "The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective."@en ;
    schema:description "J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM -- E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies -- M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements -- L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip -- D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations -- M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/364540264> ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://worldcat.org/issn/1434-4904> ; # Nanoscience and technology.
    schema:isSimilarTo <http://www.worldcat.org/oclc/241054756> ;
    schema:name "Applied scanning probe methods XI scanning probe microscopy techniques"@en ;
    schema:productID "311303119" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/311303119#PublicationEvent/berlin_heidelberg_springer_berlin_heidelberg_2009> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/364540264#Agent/springer_berlin_heidelberg> ; # Springer Berlin Heidelberg
    schema:url <http://dx.doi.org/10.1007/978-3-540-85037-3> ;
    schema:url <http://swb.eblib.com/patron/FullRecord.aspx?p=603359> ;
    schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=603359> ;
    schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340433> ;
    schema:url <http://site.ebrary.com/id/10253677> ;
    schema:workExample <http://worldcat.org/isbn/9783540850373> ;
    schema:workExample <http://dx.doi.org/10.1007/978-3-540-85037-3> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/311303119> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/364540264#Agent/springer_berlin_heidelberg> # Springer Berlin Heidelberg
    a bgn:Agent ;
    schema:name "Springer Berlin Heidelberg" ;
    .

<http://experiment.worldcat.org/entity/work/data/364540264#Place/berlin_heidelberg> # Berlin, Heidelberg
    a schema:Place ;
    schema:name "Berlin, Heidelberg" ;
    .

<http://experiment.worldcat.org/entity/work/data/364540264#Topic/materials_microscopy> # Materials--Microscopy
    a schema:Intangible ;
    schema:name "Materials--Microscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/364540264#Topic/physical_chemistry> # Physical Chemistry
    a schema:Intangible ;
    schema:name "Physical Chemistry"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/364540264#Topic/scanning_probe_microscopy> # Scanning probe microscopy
    a schema:Intangible ;
    schema:name "Scanning probe microscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/364540264#Topic/scanning_probe_microscopy_industrial_applications> # Scanning probe microscopy--Industrial applications
    a schema:Intangible ;
    schema:name "Scanning probe microscopy--Industrial applications"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/364540264#Topic/science_des_materiaux> # Science des matériaux
    a schema:Intangible ;
    schema:name "Science des matériaux"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/364540264#Topic/science_microscopes_&_microscopy> # SCIENCE--Microscopes & Microscopy
    a schema:Intangible ;
    schema:name "SCIENCE--Microscopes & Microscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/364540264#Topic/solid_state_physics_and_spectroscopy> # Solid State Physics and Spectroscopy
    a schema:Intangible ;
    schema:name "Solid State Physics and Spectroscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/364540264#Topic/surfaces_and_interfaces_thin_films> # Surfaces and Interfaces, Thin Films
    a schema:Intangible ;
    schema:name "Surfaces and Interfaces, Thin Films"@en ;
    .

<http://id.worldcat.org/fast/1032639> # Nanotechnology
    a schema:Intangible ;
    schema:name "Nanotechnology"@en ;
    .

<http://id.worldcat.org/fast/1054130> # Particles (Nuclear physics)
    a schema:Intangible ;
    schema:name "Particles (Nuclear physics)"@en ;
    .

<http://id.worldcat.org/fast/1070588> # Polymers
    a schema:Intangible ;
    schema:name "Polymers"@en ;
    .

<http://id.worldcat.org/fast/1139265> # Surfaces (Physics)
    a schema:Intangible ;
    schema:name "Surfaces (Physics)"@en ;
    .

<http://id.worldcat.org/fast/1715687> # Physical organic chemistry
    a schema:Intangible ;
    schema:name "Physical organic chemistry"@en ;
    .

<http://viaf.org/viaf/2544727> # Bharat Bhushan
    a schema:Person ;
    schema:birthDate "1949" ;
    schema:familyName "Bhushan" ;
    schema:givenName "Bharat" ;
    schema:name "Bharat Bhushan" ;
    .

<http://viaf.org/viaf/294988852> # Harald Fuchs
    a schema:Person ;
    schema:familyName "Fuchs" ;
    schema:givenName "Harald" ;
    schema:givenName "H." ;
    schema:name "Harald Fuchs" ;
    .

<http://worldcat.org/isbn/9783540850373>
    a schema:ProductModel ;
    schema:isbn "3540850376" ;
    schema:isbn "9783540850373" ;
    .

<http://worldcat.org/issn/1434-4904> # Nanoscience and technology.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/311303119> ; # Applied scanning probe methods XI scanning probe microscopy techniques
    schema:issn "1434-4904" ;
    schema:name "Nanoscience and technology." ;
    schema:name "Nanoscience and technology," ;
    .

<http://www.worldcat.org/oclc/241054756>
    a schema:CreativeWork ;
    rdfs:label "Applied Scanning Probe Methods XI." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/311303119> ; # Applied scanning probe methods XI scanning probe microscopy techniques
    .


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