aller au contenu
Applied scanning probe methods XI : scanning probe microscopy techniques Aperçu de cet ouvrage
FermerAperçu de cet ouvrage
Vérifiant…

Applied scanning probe methods XI : scanning probe microscopy techniques

Auteur : Bharat Bhushan; H Fuchs
Éditeur : Berlin ; London : Springer, ©2009.
Collection : Nanoscience and technology.
Édition/format :   Livre électronique : Document : AnglaisVoir toutes les éditions et les formats
Base de données :WorldCat
Résumé :
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  Lire la suite...
Évaluation :

(pas encore évalué) 0 avec des critiques - Soyez le premier.

Sujets
Plus comme ceci

 

Trouver un exemplaire en ligne

Liens vers cet ouvrage

Trouver un exemplaire dans la bibliothèque

&AllPage.SpinnerRetrieving; Recherche de bibliothèques qui possèdent cet ouvrage...

Détails

Genre/forme : Electronic books
Format – détails additionnels : Print version:
Applied scanning probe methods XI.
Berlin ; London : Springer, 2008
(OCoLC)241054756
Type d’ouvrage : Document, Ressource Internet
Format : Ressource Internet, Fichier informatique
Tous les auteurs / collaborateurs : Bharat Bhushan; H Fuchs
ISBN : 9783540850373 3540850376
Numéro OCLC : 310353447
Description : 1 online resource.
Contenu : J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM --
E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation --
M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies --
M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science --
DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements --
L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip --
D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations --
M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Titre de collection : Nanoscience and technology.
Responsabilité : edited by Bharat Bhushan, Harald Fuchs.
Plus d’informations :

Résumé :

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  Lire la suite...

Critiques

Critiques éditoriales

Synopsis de l’éditeur

From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the Lire la suite...

 
Critiques d’utilisateurs
Récupération des critiques de GoodReads...
Récuperation des critiques DOGObooks…

Tags

Soyez le premier.
Confirmez cette demande

Vous avez peut-être déjà demandé cet ouvrage. Veuillez sélectionner OK si vous voulez poursuivre avec cette demande quand même.

Données liées


<http://www.worldcat.org/oclc/310353447>
library:oclcnum"310353447"
library:placeOfPublication
library:placeOfPublication
library:placeOfPublication
owl:sameAs<info:oclcnum/310353447>
rdf:typeschema:Book
schema:about
schema:about
<http://id.loc.gov/authorities/subjects/sh92001586>
rdf:typeschema:Intangible
schema:name"Scanning probe microscopy--Industrial applications."@en
schema:name"Scanning probe microscopy."@en
schema:about
schema:about
schema:about
schema:bookFormatschema:EBook
schema:contributor
schema:contributor
schema:copyrightYear"2009"
schema:datePublished"2009"
schema:description"J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM -- E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies -- M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements -- L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip -- D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations -- M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction."@en
schema:description"The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective."@en
schema:exampleOfWork<http://worldcat.org/entity/work/id/906066081>
schema:genre"Electronic books."@en
schema:inLanguage"en"
schema:name"Applied scanning probe methods XI scanning probe microscopy techniques"@en
schema:publisher
schema:url
schema:url<http://dx.doi.org/10.1007/978-3-540-85037-3>
schema:workExample

Content-negotiable representations

Fermer la fenêtre

Veuillez vous identifier dans WorldCat 

Vous n’avez pas de compte? Vous pouvez facilement créer un compte gratuit.