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Applied scanning probe methods XI : scanning probe microscopy techniques

Autore: Bharat Bhushan; H Fuchs
Editore: Berlin ; London : Springer, ©2009.
Serie: Nanoscience and technology.
Edizione/Formato:   eBook : Document : EnglishVedi tutte le edizioni e i formati
Banca dati:WorldCat
Sommario:
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  Per saperne di più…
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Genere/forma: Electronic books
Informazioni aggiuntive sul formato: Print version:
Applied scanning probe methods XI.
Berlin ; London : Springer, 2008
(OCoLC)241054756
Tipo materiale: Document, Risorsa internet
Tipo documento: Internet Resource, Computer File
Tutti gli autori / Collaboratori: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
Numero OCLC: 310353447
Descrizione: 1 online resource.
Contenuti: J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM --
E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation --
M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies --
M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science --
DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements --
L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip --
D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations --
M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Titolo della serie: Nanoscience and technology.
Responsabilità: edited by Bharat Bhushan, Harald Fuchs.
Maggiori informazioni:

Abstract:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  Per saperne di più…

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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the Per saperne di più…

 
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<http://www.worldcat.org/oclc/310353447>
library:oclcnum"310353447"
library:placeOfPublication
library:placeOfPublication
library:placeOfPublication
owl:sameAs<info:oclcnum/310353447>
rdf:typeschema:Book
schema:about
schema:about
<http://id.loc.gov/authorities/subjects/sh92001586>
rdf:typeschema:Intangible
schema:name"Scanning probe microscopy--Industrial applications."@en
schema:name"Scanning probe microscopy."@en
schema:about
schema:about
schema:about
schema:bookFormatschema:EBook
schema:contributor
schema:contributor
schema:copyrightYear"2009"
schema:datePublished"2009"
schema:description"J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM -- E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies -- M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements -- L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip -- D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations -- M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction."@en
schema:description"The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective."@en
schema:exampleOfWork<http://worldcat.org/entity/work/id/906066081>
schema:genre"Electronic books."@en
schema:inLanguage"en"
schema:name"Applied scanning probe methods XI scanning probe microscopy techniques"@en
schema:publisher
schema:url
schema:url<http://dx.doi.org/10.1007/978-3-540-85037-3>
schema:workExample

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