doorgaan naar inhoud
Applied scanning probe methods XI : scanning probe microscopy techniques Voorbeeldweergave van dit item
SluitenVoorbeeldweergave van dit item
Bezig met controle...

Applied scanning probe methods XI : scanning probe microscopy techniques

Auteur: Bharat Bhushan; H Fuchs
Uitgever: Berlin ; London : Springer, ©2009.
Serie: Nanoscience and technology.
Editie/Formaat:   eBoek : Document : EngelsAlle edities en materiaalsoorten bekijken.
Database:WorldCat
Samenvatting:
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  Meer lezen...
Beoordeling:

(nog niet beoordeeld) 0 met beoordelingen - U bent de eerste

Onderwerpen
Meer in deze trant

 

Zoeken naar een online exemplaar

Links naar dit item

Zoeken naar een in de bibliotheek beschikbaar exemplaar

&AllPage.SpinnerRetrieving; Bibliotheken met dit item worden gezocht…

Details

Genre/Vorm: Electronic books
Aanvullende fysieke materiaalsoort: Print version:
Applied scanning probe methods XI.
Berlin ; London : Springer, 2008
(OCoLC)241054756
Genre: Document, Internetbron
Soort document: Internetbron, Computerbestand
Alle auteurs / medewerkers: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
OCLC-nummer: 310353447
Beschrijving: 1 online resource.
Inhoud: J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM --
E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation --
M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies --
M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science --
DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements --
L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip --
D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations --
M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Serietitel: Nanoscience and technology.
Verantwoordelijkheid: edited by Bharat Bhushan, Harald Fuchs.
Meer informatie:

Fragment:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  Meer lezen...

Beoordelingen

Professionele beoordelingen

Synopsis uitgever

From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the Meer lezen...

 
Beoordelingen door gebruikers
Beoordelingen van GoodReads worden opgehaald...
Bezig met opvragen DOGObooks-reviews...

Tags

U bent de eerste.
Bevestig deze aanvraag

Misschien heeft u dit item reeds aangevraagd. Selecteer a.u.b. Ok als u toch wilt doorgaan met deze aanvraag.

Gekoppelde data


<http://www.worldcat.org/oclc/310353447>
library:oclcnum"310353447"
library:placeOfPublication
library:placeOfPublication
library:placeOfPublication
owl:sameAs<info:oclcnum/310353447>
rdf:typeschema:Book
schema:about
schema:about
<http://id.loc.gov/authorities/subjects/sh92001586>
rdf:typeschema:Intangible
schema:name"Scanning probe microscopy--Industrial applications."@en
schema:name"Scanning probe microscopy."@en
schema:about
schema:about
schema:about
schema:bookFormatschema:EBook
schema:contributor
schema:contributor
schema:copyrightYear"2009"
schema:datePublished"2009"
schema:description"J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM -- E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies -- M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements -- L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip -- D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations -- M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction."@en
schema:description"The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective."@en
schema:exampleOfWork<http://worldcat.org/entity/work/id/906066081>
schema:genre"Electronic books."@en
schema:inLanguage"en"
schema:name"Applied scanning probe methods XI scanning probe microscopy techniques"@en
schema:publisher
schema:url
schema:url<http://dx.doi.org/10.1007/978-3-540-85037-3>
schema:workExample

Content-negotiable representations

Venster sluiten

Meld u aan bij WorldCat 

Heeft u geen account? U kunt eenvoudig een nieuwe gratis account aanmaken.