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Applied scanning probe methods XI : scanning probe microscopy techniques

Autor: Bharat Bhushan; H Fuchs
Editora: Berlin ; London : Springer, ©2009.
Séries: Nanoscience and technology.
Edição/Formato   e-book : Documento : InglêsVer todas as edições e formatos
Base de Dados:WorldCat
Resumo:
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  Ler mais...
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Gênero/Forma: Electronic books
Formato Físico Adicional: Print version:
Applied scanning probe methods XI.
Berlin ; London : Springer, 2008
(OCoLC)241054756
Tipo de Material: Documento, Recurso Internet
Tipo de Documento: Recurso Internet, Arquivo de Computador
Todos os Autores / Contribuintes: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
Número OCLC: 310353447
Descrição: 1 online resource.
Conteúdos: J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM --
E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation --
M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies --
M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science --
DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements --
L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip --
D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations --
M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Título da Série: Nanoscience and technology.
Responsabilidade: edited by Bharat Bhushan, Harald Fuchs.

Resumo:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  Ler mais...

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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the Ler mais...

 
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Primary Entity

<http://www.worldcat.org/oclc/310353447> # Applied scanning probe methods XI scanning probe microscopy techniques
    a schema:MediaObject, schema:Book, schema:CreativeWork ;
    library:oclcnum "310353447" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/906066081#Place/berlin> ; # Berlin
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
    library:placeOfPublication <http://dbpedia.org/resource/London> ; # London
    schema:about <http://id.worldcat.org/fast/1106485> ; # Scanning probe microscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/906066081#Topic/scanning_probe_microscopy_industrial_applications> ; # Scanning probe microscopy--Industrial applications
    schema:about <http://id.loc.gov/authorities/subjects/sh92001586> ; # Scanning probe microscopy
    schema:about <http://dewey.info/class/502.82/e22/> ;
    schema:about <http://id.loc.gov/authorities/subjects/sh85082081> ; # Materials--Microscopy
    schema:about <http://id.worldcat.org/fast/1011856> ; # Materials--Microscopy
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/17463586> ; # Harald Fuchs
    schema:contributor <http://viaf.org/viaf/2544727> ; # Bharat Bhushan
    schema:copyrightYear "2009" ;
    schema:datePublished "2009" ;
    schema:description "J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM -- E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies -- M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements -- L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip -- D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations -- M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction."@en ;
    schema:description "The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/906066081> ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/906066081#Series/nanoscience_and_technology> ; # Nanoscience and technology.
    schema:isSimilarTo <http://www.worldcat.org/oclc/241054756> ;
    schema:name "Applied scanning probe methods XI scanning probe microscopy techniques"@en ;
    schema:productID "310353447" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/310353447#PublicationEvent/berlin_london_springer_c2009> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/906066081#Agent/springer> ; # Springer
    schema:url <http://dx.doi.org/10.1007/978-3-540-85037-3> ;
    schema:workExample <http://worldcat.org/isbn/9783540850373> ;
    schema:workExample <http://dx.doi.org/10.1007/978-3-540-85037-3> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/310353447> ;
    .


Related Entities

<http://dbpedia.org/resource/London> # London
    a schema:Place ;
    schema:name "London" ;
    .

<http://experiment.worldcat.org/entity/work/data/906066081#Series/nanoscience_and_technology> # Nanoscience and technology.
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/310353447> ; # Applied scanning probe methods XI scanning probe microscopy techniques
    schema:name "Nanoscience and technology." ;
    schema:name "Nanoscience and technology" ;
    .

<http://experiment.worldcat.org/entity/work/data/906066081#Topic/scanning_probe_microscopy_industrial_applications> # Scanning probe microscopy--Industrial applications
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh92001586> ; # Scanning probe microscopy
    schema:name "Scanning probe microscopy--Industrial applications"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85082081> # Materials--Microscopy
    a schema:Intangible ;
    schema:name "Materials--Microscopy"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh92001586> # Scanning probe microscopy
    a schema:Intangible ;
    schema:name "Scanning probe microscopy"@en ;
    .

<http://id.worldcat.org/fast/1011856> # Materials--Microscopy
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh85082081> ; # Materials--Microscopy
    schema:name "Materials--Microscopy"@en ;
    .

<http://id.worldcat.org/fast/1106485> # Scanning probe microscopy
    a schema:Intangible ;
    schema:name "Scanning probe microscopy"@en ;
    .

<http://viaf.org/viaf/17463586> # Harald Fuchs
    a schema:Person ;
    schema:familyName "Fuchs" ;
    schema:givenName "Harald" ;
    schema:givenName "H." ;
    schema:name "Harald Fuchs" ;
    .

<http://viaf.org/viaf/2544727> # Bharat Bhushan
    a schema:Person ;
    schema:birthDate "1949" ;
    schema:familyName "Bhushan" ;
    schema:givenName "Bharat" ;
    schema:name "Bharat Bhushan" ;
    .

<http://worldcat.org/isbn/9783540850373>
    a schema:ProductModel ;
    schema:description "electronic book" ;
    schema:isbn "3540850376" ;
    schema:isbn "9783540850373" ;
    .

<http://www.worldcat.org/oclc/241054756>
    a schema:CreativeWork ;
    rdfs:label "Applied scanning probe methods XI." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/310353447> ; # Applied scanning probe methods XI scanning probe microscopy techniques
    .


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