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Applied scanning probe methods XI : scanning probe microscopy techniques

ผู้แต่ง: Bharat Bhushan; H Fuchs
สำนักพิมพ์: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
ชุด: Nanoscience and technology.
ครั้งที่พิมพ์/รูปแบบ:   หนังสืออีเล็กทรอนิกส์ : เอกสาร : ภาษาอังกฤษดูครั้งที่พิมพ์และรูปแบบ
ฐานข้อมูล:WorldCat
สรุป:
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  อ่านมากขึ้น…
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รูปแบบทางกายภาพเพิ่มเติม Print version:
Bhushan, Bharat.
Applied Scanning Probe Methods XI.
Berlin, Heidelberg : Springer Berlin Heidelberg, 2009
(OCoLC)241054756
ขนิดวัสดุ: เอกสาร, ทรัพยากรอินแทอร์เน็ต
ประเภทของเอกสาร: แหล่งข้อมูลอินเทอร์เน็ต, ไฟล์คอมพิวเตอร์
ผู้แต่งทั้งหมด : ผู้แต่งร่วม Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
OCLC Number: 311303119
คำอธิบาย: 1 online resource.
สารบัญ: J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM --
E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation --
M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies --
M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science --
DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements --
L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip --
D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations --
M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
ชื่อชุด: Nanoscience and technology.
ความรับผิดชอบ: edited by Bharat Bhushan, Harald Fuchs.
ข้อมูลเพิ่มเติม

บทคัดย่อ:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  อ่านมากขึ้น…

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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the อ่านมากขึ้น…

 
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