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Applied scanning probe methods XI : scanning probe microscopy techniques

作者: Bharat Bhushan; H Fuchs
出版商: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
叢書: Nanoscience and technology.
版本/格式:   電子書 : 文獻 : 英語所有版本和格式的總覽
資料庫:WorldCat
提要:
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  再讀一些...
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類型/形式: Electronic books
其他的實體格式: Print version:
Bhushan, Bharat.
Applied Scanning Probe Methods XI.
Berlin, Heidelberg : Springer Berlin Heidelberg, 2009
(OCoLC)241054756
資料類型: 文獻, 網際網路資源
文件類型 網際網路資源, 電腦檔案
所有的作者/貢獻者: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
OCLC系統控制編碼: 311303119
描述: 1 online resource.
内容: J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM --
E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation --
M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies --
M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science --
DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements --
L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip --
D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations --
M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
叢書名: Nanoscience and technology.
責任: edited by Bharat Bhushan, Harald Fuchs.
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摘要:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  再讀一些...

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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the 再讀一些...

 
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