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Applied scanning probe methods XI : scanning probe microscopy techniques

作者: Bharat Bhushan; H Fuchs
出版商: Berlin ; London : Springer, ©2009.
叢書: Nanoscience and technology.
版本/格式:   電子書 : 文獻 : 英語所有版本和格式的總覽
資料庫:WorldCat
提要:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  再讀一些...

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類型/形式: Electronic books
其他的實體格式: Print version:
Applied scanning probe methods XI.
Berlin ; London : Springer, 2008
(OCoLC)241054756
資料類型: 文獻, 網際網路資源
文件類型: 網路資源, 電腦資料
所有的作者/貢獻者: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
OCLC系統控制編碼: 310353447
描述: 1 online resource.
内容: Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
叢書名: Nanoscience and technology.
責任: edited by Bharat Bhushan, Harald Fuchs.
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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the 再讀一些...

 
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