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Applied scanning probe methods XI : scanning probe microscopy techniques

Author: Bharat Bhushan; H Fuchs
Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
Series: Nanoscience and technology.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  Read more...

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Genre/Form: Electronic books
Additional Physical Format: Print version:
Bhushan, Bharat.
Applied Scanning Probe Methods XI.
Berlin, Heidelberg : Springer Berlin Heidelberg, 2009
(OCoLC)241054756
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
OCLC Number: 311303119
Description: 1 online resource.
Contents: Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Series Title: Nanoscience and technology.
Responsibility: edited by Bharat Bhushan, Harald Fuchs.
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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the Read more...

 
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