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Applied scanning probe methods XI : scanning probe microscopy techniques

Autor Bharat Bhushan; H Fuchs
Vydavatel: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
Edice: Nanoscience and technology.
Vydání/formát:   e-kniha : Document : EnglishZobrazit všechny vydání a formáty
Databáze:WorldCat
Shrnutí:
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  Přečíst více...
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Žánr/forma: Electronic books
Doplňující formát: Print version:
Bhushan, Bharat.
Applied Scanning Probe Methods XI.
Berlin, Heidelberg : Springer Berlin Heidelberg, 2009
(OCoLC)241054756
Typ materiálu: Document, Internetový zdroj
Typ dokumentu Internetový zdroj, Počítačový soubor
Všichni autoři/tvůrci: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
OCLC číslo: 311303119
Popis: 1 online resource.
Obsahy: J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM --
E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation --
M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies --
M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science --
DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements --
L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip --
D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations --
M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Název edice: Nanoscience and technology.
Odpovědnost: edited by Bharat Bhushan, Harald Fuchs.
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  Přečíst více...

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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the Přečíst více...

 
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Primary Entity

<http://www.worldcat.org/oclc/311303119> # Applied scanning probe methods XI : scanning probe microscopy techniques
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
   library:oclcnum "311303119" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/3943712099#Place/berlin_heidelberg> ; # Berlin, Heidelberg
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
   schema:about <http://id.worldcat.org/fast/1054130> ; # Particles (Nuclear physics)
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/solid_state_physics_and_spectroscopy> ; # Solid State Physics and Spectroscopy
   schema:about <http://id.worldcat.org/fast/1070588> ; # Polymers
   schema:about <http://id.worldcat.org/fast/1715687> ; # Physical organic chemistry
   schema:about <http://id.worldcat.org/fast/1139265> ; # Surfaces (Physics)
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/scanning_probe_microscopy_industrial_applications> ; # Scanning probe microscopy--Industrial applications
   schema:about <http://id.worldcat.org/fast/1032639> ; # Nanotechnology
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/materials_microscopy> ; # Materials--Microscopy
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/polymer_sciences> ; # Polymer Sciences
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/physical_chemistry> ; # Physical Chemistry
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/chemistry> ; # Chemistry
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/science_microscopes_&_microscopy> ; # SCIENCE--Microscopes & Microscopy
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/science_des_materiaux> ; # Science des matériaux
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/surfaces_and_interfaces_thin_films> ; # Surfaces and Interfaces, Thin Films
   schema:about <http://dewey.info/class/502.82/e22/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/chimie> ; # Chimie
   schema:about <http://experiment.worldcat.org/entity/work/data/3943712099#Topic/scanning_probe_microscopy> ; # Scanning probe microscopy
   schema:bookFormat schema:EBook ;
   schema:contributor <http://viaf.org/viaf/17463586> ; # Harald Fuchs
   schema:contributor <http://viaf.org/viaf/2544727> ; # Bharat Bhushan
   schema:datePublished "2009" ;
   schema:description "The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective."@en ;
   schema:description "J. Jersch and H. Fuchs: Oscillation Control in Dynamic SPM -- E. Bonaccurso, D. Golovko, H-J Butt, R. Raiteri, P. Bonanno, T. Haschke, and W. Wiechert: Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation -- M. Teresa Cuberes: Mechanical-Diode based Ultrasonic Atomic Force Microscopies -- M. Brogly, H. Awada, and O. Noel: Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science -- DC Hurley: Contact-Resonance Spectroscopy Techniques for Nanomechanical Measurements -- L. Calabri, N. Pugno, and S. Valeri: AFM Nanoindentation Method: Geometrical effects of the Indenter Tip -- D. Tranchida and S. Piccarolo: Local mechanical properties by Atomic Force Microscopy Nanoindentations -- M. Evstigneev: Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/3943712099> ;
   schema:genre "Electronic books"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://worldcat.org/issn/1434-4904> ; # Nanoscience and technology.
   schema:isSimilarTo <http://www.worldcat.org/oclc/241054756> ;
   schema:name "Applied scanning probe methods XI : scanning probe microscopy techniques"@en ;
   schema:productID "311303119" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/311303119#PublicationEvent/berlin_heidelberg_springer_berlin_heidelberg_2009> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/3943712099#Agent/springer_berlin_heidelberg> ; # Springer Berlin Heidelberg
   schema:url <http://dx.doi.org/10.1007/978-3-540-85037-3> ;
   schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=603359> ;
   schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=340433> ;
   schema:url <http://site.ebrary.com/id/10253677> ;
   schema:url <http://proxy.lib.siu.edu/login?url=http://dx.doi.org/10.1007/978-3-540-85037-3> ;
   schema:workExample <http://worldcat.org/isbn/9783540850373> ;
   schema:workExample <http://dx.doi.org/10.1007/978-3-540-85037-3> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/311303119> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/3943712099#Agent/springer_berlin_heidelberg> # Springer Berlin Heidelberg
    a bgn:Agent ;
   schema:name "Springer Berlin Heidelberg" ;
    .

<http://experiment.worldcat.org/entity/work/data/3943712099#Place/berlin_heidelberg> # Berlin, Heidelberg
    a schema:Place ;
   schema:name "Berlin, Heidelberg" ;
    .

<http://experiment.worldcat.org/entity/work/data/3943712099#Topic/materials_microscopy> # Materials--Microscopy
    a schema:Intangible ;
   schema:name "Materials--Microscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/3943712099#Topic/scanning_probe_microscopy> # Scanning probe microscopy
    a schema:Intangible ;
   schema:name "Scanning probe microscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/3943712099#Topic/scanning_probe_microscopy_industrial_applications> # Scanning probe microscopy--Industrial applications
    a schema:Intangible ;
   schema:name "Scanning probe microscopy--Industrial applications"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/3943712099#Topic/science_des_materiaux> # Science des matériaux
    a schema:Intangible ;
   schema:name "Science des matériaux"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/3943712099#Topic/science_microscopes_&_microscopy> # SCIENCE--Microscopes & Microscopy
    a schema:Intangible ;
   schema:name "SCIENCE--Microscopes & Microscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/3943712099#Topic/solid_state_physics_and_spectroscopy> # Solid State Physics and Spectroscopy
    a schema:Intangible ;
   schema:name "Solid State Physics and Spectroscopy"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/3943712099#Topic/surfaces_and_interfaces_thin_films> # Surfaces and Interfaces, Thin Films
    a schema:Intangible ;
   schema:name "Surfaces and Interfaces, Thin Films"@en ;
    .

<http://id.worldcat.org/fast/1032639> # Nanotechnology
    a schema:Intangible ;
   schema:name "Nanotechnology"@en ;
    .

<http://id.worldcat.org/fast/1054130> # Particles (Nuclear physics)
    a schema:Intangible ;
   schema:name "Particles (Nuclear physics)"@en ;
    .

<http://id.worldcat.org/fast/1070588> # Polymers
    a schema:Intangible ;
   schema:name "Polymers"@en ;
    .

<http://id.worldcat.org/fast/1139265> # Surfaces (Physics)
    a schema:Intangible ;
   schema:name "Surfaces (Physics)"@en ;
    .

<http://id.worldcat.org/fast/1715687> # Physical organic chemistry
    a schema:Intangible ;
   schema:name "Physical organic chemistry"@en ;
    .

<http://proxy.lib.siu.edu/login?url=http://dx.doi.org/10.1007/978-3-540-85037-3>
   rdfs:comment "Available online to current SIUC students, faculty and staff only." ;
    .

<http://viaf.org/viaf/17463586> # Harald Fuchs
    a schema:Person ;
   schema:familyName "Fuchs" ;
   schema:givenName "Harald" ;
   schema:givenName "H." ;
   schema:name "Harald Fuchs" ;
    .

<http://viaf.org/viaf/2544727> # Bharat Bhushan
    a schema:Person ;
   schema:birthDate "1949" ;
   schema:familyName "Bhushan" ;
   schema:givenName "Bharat" ;
   schema:name "Bharat Bhushan" ;
    .

<http://worldcat.org/isbn/9783540850373>
    a schema:ProductModel ;
   schema:isbn "3540850376" ;
   schema:isbn "9783540850373" ;
    .

<http://worldcat.org/issn/1434-4904> # Nanoscience and technology.
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/311303119> ; # Applied scanning probe methods XI : scanning probe microscopy techniques
   schema:issn "1434-4904" ;
   schema:name "Nanoscience and technology." ;
   schema:name "Nanoscience and technology," ;
    .

<http://www.worldcat.org/oclc/241054756>
    a schema:CreativeWork ;
   rdfs:label "Applied Scanning Probe Methods XI." ;
   schema:description "Print version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/311303119> ; # Applied scanning probe methods XI : scanning probe microscopy techniques
    .


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