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Applied scanning probe methods XI : scanning probe microscopy techniques

著者: Bharat Bhushan; H Fuchs
出版商: Berlin, Heidelberg : Springer Berlin Heidelberg, 2009.
丛书: Nanoscience and technology.
版本/格式:   电子图书 : 文献 : 英语查看所有的版本和格式
数据库:WorldCat
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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM  再读一些...

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类型/形式: Electronic books
附加的形体格式: Print version:
Bhushan, Bharat.
Applied Scanning Probe Methods XI.
Berlin, Heidelberg : Springer Berlin Heidelberg, 2009
(OCoLC)241054756
材料类型: 文献, 互联网资源
文件类型: 互联网资源, 计算机文档
所有的著者/提供者: Bharat Bhushan; H Fuchs
ISBN: 9783540850373 3540850376
OCLC号码: 311303119
描述: 1 online resource.
内容: Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
丛书名: Nanoscience and technology.
责任: edited by Bharat Bhushan, Harald Fuchs.
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From the reviews: "Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. ... The editors and their talented authors have been among the leaders in the 再读一些...

 
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