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Applied scanning probe methods

Author: Bharat Bhushan; H Fuchs; Satoshi Kawata; M Tomitori
Publisher: Berlin : Springer, 2006-2009.
Series: Nanoscience and technology
Edition/Format:   eBook : Document : EnglishView all editions and formats
Database:WorldCat
Summary:
The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute  Read more...
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Details

Additional Physical Format: Printed edition:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Bharat Bhushan; H Fuchs; Satoshi Kawata; M Tomitori
ISBN: 3540274537 9783540274537 354026910X 9783540269106 3540269142 9783540269144 3540373160 9783540373162 3540373195 9783540373193 3540373217 9783540373216 3540740805 9783540740803 354074083X 9783540740834 3540740856 9783540740858 3540850376 9783540850373 3540850392 9783540850397 354085049X 9783540850496 9783540850380 3540850384
OCLC Number: 788032087
Notes: Title from PDF title page.
Vols. 2-4, 7, 11-13: volume editors, Bharat Bhushan, Harald Fuchs ; vol. 5: volume editors, Bharat Bhushan, Harald Fuchs, Satoshi Kawata ; vol. 6: volume editors, Bharat Bhushan, Satoshi Kawata ; vols. 8-10: volume editors, Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.
Description: 1 online resource (12 volumes <2-13>) : illustrations (some color).
Contents: V. 2, 5, 8, 11. Scanning probe microscopy techniques --
v. 3, 6, 9, 12. Characterization --
v. 4. Industrial applications --
v. 7, 10, 13. Biomimetics and industrial applications.
Series Title: Nanoscience and technology
Other Titles: Scanning probe microscopy techniques
Characterization
Industrial applications
Biomimetics and industrial applications
Responsibility: Bharat Bhushan, Harald Fuchs [editors].

Abstract:

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

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