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Applied statistics : regression and analysis of variance

Author: Bayo Lawal; Felix Famoye
Publisher: Lanham : University Press of America ; [2013]. ©2013.
Edition/Format:   Print book : EnglishView all editions and formats
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This book presents a thorough treatment of the methods of regression and analysis of variance. Applied Statistics requires an understanding of introductory statistics courses and is suitable for both  Read more...

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Document Type: Book
All Authors / Contributors: Bayo Lawal; Felix Famoye
ISBN: 9780761861713 0761861718
OCLC Number: 852833514
Description: xvi, 527 pages : illustrations ; 28 cm
Contents: 1: Introduction2: Simple Linear Regression3: Inferences on Parameter Estimates4: Mutiple Linear Regression5: Regression Diagnostics and Remedial Methods6: Multiple and Partial Correlations7: Model Selection Strategies8: Use of Dummy Variables in Regression Analysis9: Polynomial Regression10: Logistic Regression11: Count Data Regression Models12: Regression with Censored of Truncated Data13: Nonlinear Regression14: One-Way Analysis of Variance15: Two-Factor Analysis of Variance16: Analysis of Covariance17: Randomized Complete Block Design18: Non Orthogonal Classification
Responsibility: Bayo Lawal and Felix Famoye.

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Applied Statistics . . . extensive coverage of regression and analysis of variance techniques combined with its exemplary demonstration of SAS coding through examples make it a valuable resource for Read more...

 
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Linked Data


Primary Entity

<http://www.worldcat.org/oclc/852833514> # Applied statistics : regression and analysis of variance
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "852833514" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mdu> ;
    schema:about <http://dewey.info/class/519.542/e23/> ;
    schema:about <http://id.worldcat.org/fast/808330> ; # Analysis of variance
    schema:about <http://id.worldcat.org/fast/1432090> ; # Regression analysis
    schema:author <http://viaf.org/viaf/6763989> ; # H. Bayo Lawal
    schema:author <http://viaf.org/viaf/6047497> ; # Felix Famoye
    schema:bookFormat bgn:PrintBook ;
    schema:datePublished "2013" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/1367716743> ;
    schema:inLanguage "en" ;
    schema:name "Applied statistics : regression and analysis of variance"@en ;
    schema:productID "852833514" ;
    schema:workExample <http://worldcat.org/isbn/9780761861713> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/852833514> ;
    .


Related Entities

<http://id.worldcat.org/fast/1432090> # Regression analysis
    a schema:Intangible ;
    schema:name "Regression analysis"@en ;
    .

<http://id.worldcat.org/fast/808330> # Analysis of variance
    a schema:Intangible ;
    schema:name "Analysis of variance"@en ;
    .

<http://viaf.org/viaf/6047497> # Felix Famoye
    a schema:Person ;
    schema:birthDate "1956" ;
    schema:familyName "Famoye" ;
    schema:givenName "Felix" ;
    schema:name "Felix Famoye" ;
    .

<http://viaf.org/viaf/6763989> # H. Bayo Lawal
    a schema:Person ;
    schema:familyName "Lawal" ;
    schema:givenName "H. Bayo" ;
    schema:givenName "Bayo" ;
    schema:name "H. Bayo Lawal" ;
    .

<http://worldcat.org/isbn/9780761861713>
    a schema:ProductModel ;
    schema:isbn "0761861718" ;
    schema:isbn "9780761861713" ;
    .


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