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Are all patent examiners equal? : the impact of characteristics on patent statistics and litigation outcomes

Autor: Iain Cockburn; Samuel Kortum; Scott Stern; National Bureau of Economic Research.
Editorial: Cambridge, MA. : National Bureau of Economic Research, ©2002.
Serie: Working paper series (National Bureau of Economic Research), working paper no. 8980.
Edición/Formato:   Print book : Inglés (eng)Ver todas las ediciones y todos los formatos
Base de datos:WorldCat
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Tipo de material: Recurso en Internet
Tipo de documento: Libro/Texto, Recurso en Internet
Todos autores / colaboradores: Iain Cockburn; Samuel Kortum; Scott Stern; National Bureau of Economic Research.
Número OCLC: 50399340
Notas: "June 2002."
Descripción: 34, [8] pages : illustrations ; 22 cm.
Título de la serie: Working paper series (National Bureau of Economic Research), working paper no. 8980.
Responsabilidad: Iain M. Cockburn, Samuel Kortum, Scott Stern.

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Datos enlazados


Primary Entity

<http://www.worldcat.org/oclc/50399340> # Are all patent examiners equal? : the impact of characteristics on patent statistics and litigation outcomes
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "50399340" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mau> ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/6561585#Place/cambridge_ma> ; # Cambridge, MA.
   schema:about <http://id.worldcat.org/fast/1054823> ; # Patent laws and legislation
   schema:about <http://experiment.worldcat.org/entity/work/data/6561585#Organization/united_states_patent_and_trademark_office> ; # United States. Patent and Trademark Office.
   schema:about <http://id.worldcat.org/fast/1145002> ; # Technological innovations
   schema:about <http://id.worldcat.org/fast/1204155> ; # United States.
   schema:about <http://id.loc.gov/authorities/subjects/sh2008112666> ; # Technological innovations--United States
   schema:about <http://id.loc.gov/authorities/subjects/sh2008108954> ; # Patent laws and legislation--United States
   schema:about <http://id.loc.gov/authorities/subjects/sh2008104752> ; # Intellectual property--United States
   schema:about <http://id.worldcat.org/fast/975774> ; # Intellectual property
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/3547648> ; # Samuel Kortum
   schema:contributor <http://viaf.org/viaf/127108210> ; # National Bureau of Economic Research.
   schema:contributor <http://viaf.org/viaf/18335502> ; # Scott Stern
   schema:copyrightYear "2002" ;
   schema:creator <http://viaf.org/viaf/10782448> ; # Iain Cockburn
   schema:datePublished "2002" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/6561585> ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/6561585#Series/working_paper_series_national_bureau_of_economic_research> ; # Working paper series (National Bureau of Economic Research) ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/6561585#Series/nber_working_paper_series> ; # NBER working paper series ;
   schema:name "Are all patent examiners equal? : the impact of characteristics on patent statistics and litigation outcomes"@en ;
   schema:productID "50399340" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/50399340#PublicationEvent/cambridge_ma_national_bureau_of_economic_research_2002> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/6561585#Agent/national_bureau_of_economic_research> ; # National Bureau of Economic Research
   schema:url <http://papers.nber.org/papers/w8980> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/50399340> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/6561585#Agent/national_bureau_of_economic_research> # National Bureau of Economic Research
    a bgn:Agent ;
   schema:name "National Bureau of Economic Research" ;
    .

<http://experiment.worldcat.org/entity/work/data/6561585#Organization/united_states_patent_and_trademark_office> # United States. Patent and Trademark Office.
    a schema:Organization ;
   schema:name "United States. Patent and Trademark Office." ;
    .

<http://experiment.worldcat.org/entity/work/data/6561585#Place/cambridge_ma> # Cambridge, MA.
    a schema:Place ;
   schema:name "Cambridge, MA." ;
    .

<http://experiment.worldcat.org/entity/work/data/6561585#Series/nber_working_paper_series> # NBER working paper series ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/50399340> ; # Are all patent examiners equal? : the impact of characteristics on patent statistics and litigation outcomes
   schema:name "NBER working paper series ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/6561585#Series/working_paper_series_national_bureau_of_economic_research> # Working paper series (National Bureau of Economic Research) ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/50399340> ; # Are all patent examiners equal? : the impact of characteristics on patent statistics and litigation outcomes
   schema:name "Working paper series (National Bureau of Economic Research) ;" ;
    .

<http://id.loc.gov/authorities/subjects/sh2008104752> # Intellectual property--United States
    a schema:Intangible ;
   schema:name "Intellectual property--United States"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2008108954> # Patent laws and legislation--United States
    a schema:Intangible ;
   schema:name "Patent laws and legislation--United States"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2008112666> # Technological innovations--United States
    a schema:Intangible ;
   schema:name "Technological innovations--United States"@en ;
    .

<http://id.worldcat.org/fast/1054823> # Patent laws and legislation
    a schema:Intangible ;
   schema:name "Patent laws and legislation"@en ;
    .

<http://id.worldcat.org/fast/1145002> # Technological innovations
    a schema:Intangible ;
   schema:name "Technological innovations"@en ;
    .

<http://id.worldcat.org/fast/1204155> # United States.
    a schema:Place ;
   schema:name "United States." ;
    .

<http://id.worldcat.org/fast/975774> # Intellectual property
    a schema:Intangible ;
   schema:name "Intellectual property"@en ;
    .

<http://viaf.org/viaf/10782448> # Iain Cockburn
    a schema:Person ;
   schema:familyName "Cockburn" ;
   schema:givenName "Iain" ;
   schema:name "Iain Cockburn" ;
    .

<http://viaf.org/viaf/127108210> # National Bureau of Economic Research.
    a schema:Organization ;
   schema:name "National Bureau of Economic Research." ;
    .

<http://viaf.org/viaf/18335502> # Scott Stern
    a schema:Person ;
   schema:birthDate "1969" ;
   schema:familyName "Stern" ;
   schema:givenName "Scott" ;
   schema:name "Scott Stern" ;
    .

<http://viaf.org/viaf/3547648> # Samuel Kortum
    a schema:Person ;
   schema:familyName "Kortum" ;
   schema:givenName "Samuel" ;
   schema:name "Samuel Kortum" ;
    .

<http://www.worldcat.org/title/-/oclc/50399340>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/50399340> ; # Are all patent examiners equal? : the impact of characteristics on patent statistics and litigation outcomes
   schema:dateModified "2016-05-12" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


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