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ARPA/NBS workshop III : test patterns for integrated circuits

Author: Harry A Schafft
Publisher: Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976.
Series: Semiconductor measurement technology.; NBS special publication, 400-15.
Edition/Format:   Print book : Conference publication : National government publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Schafft, Harry A.
ARPA/NBS workshop III.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976
(OCoLC)607118844
Online version:
Schafft, Harry A.
ARPA/NBS workshop III.
Washington : U.S. Dept. of Commerce, National Bureau of Standards : For sale by the Supt. of Docs., U.S. Govt. Print. Off., 1976
(OCoLC)615842747
Material Type: Conference publication, Government publication, National government publication
Document Type: Book
All Authors / Contributors: Harry A Schafft
OCLC Number: 1960350
Notes: Consists of synopses of talks and discussions presented at the workshop held Sept. 6, 1974 in Scottsdale, Ariz.
Description: v, 46 pages : illustrations ; 26 cm.
Series Title: Semiconductor measurement technology.; NBS special publication, 400-15.
Responsibility: Harry A. Schafft, editor.

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