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Artificial intelligence exchange and service tie to all test environments (AI-ESTATE).

Author: International Electrotechnical Commission.; International Electrotechnical Commission. Technical Committee 93.; Institute of Electrical and Electronics Engineers.; American National Standards Institute.; IEEE-SA Standards Board.
Publisher: Geneva : International Electrotechnical Commission ; New York : Institute of Electrical and Electronics Engineers, ©2005.
Series: International standard, IEC 62243.; Institute of Electrical and Electronics Engineers.; IEEE std.
Edition/Format:   eBook : Document : English : 1st ed. 2005-07View all editions and formats
Summary:
AI-ESTATE is a set of specifications for data interchange and for standard services for the test and diagnostic environment. The purpose of AI-ESTATE is to standardize interfaces between functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate  Read more...
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Details

Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: International Electrotechnical Commission.; International Electrotechnical Commission. Technical Committee 93.; Institute of Electrical and Electronics Engineers.; American National Standards Institute.; IEEE-SA Standards Board.
ISBN: 0738147788 9780738147789 2831880459 9782831880457
OCLC Number: 217460685
Notes: "Reference number : IEC 62243(E):2005 ; IEEE Std. 1232(E):2002"--Cover.
"International standard IEC/IEEE 62243 has been processed through IEC technical committee 93: Design automation"--Page 3.
"Published by IEC under licence from IEEE 2005"--Contents.
"Sponsor, IEEE Standards Coordinating Committee 20"--Page 5.
"Approved 13 November 2002, American National Standards Institute ; Approved 13 June 2002, IEEE-SA Standards Board."--Page 5.
Description: 1 online resource (122 pages) : illustrations.
Series Title: International standard, IEC 62243.; Institute of Electrical and Electronics Engineers.; IEEE std.
Other Titles: IEC 62243 First edition 2005-07IEEE 1232.
IEC 62243(E):2005.
IEEE Std. 1232(E):2002.
AI-ESTATE
International Standard ; IEC 62243 ; IEEE 1232

Abstract:

AI-ESTATE is a set of specifications for data interchange and for standard services for the test and diagnostic environment. The purpose of AI-ESTATE is to standardize interfaces between functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate exchange of persistent diagnostic information between two reasoners and also to provide a formal typing system for diagnostic services. This standard then defines the services to manipulate diagnostic information and to control a diagnostic reasoner.

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Primary Entity

<http://www.worldcat.org/oclc/217460685> # Artificial intelligence exchange and service tie to all test environments (AI-ESTATE).
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
    library:oclcnum "217460685" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/sz> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/479708239#Place/geneva> ; # Geneva
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/479708239#CreativeWork/iec_62243_first_edition_2005_07ieee_1232> ; # IEC 62243 First edition 2005-07IEEE 1232.
    rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/479708239#CreativeWork/ieee_std_1232_e_2002> ; # IEEE Std. 1232(E):2002.
    rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/479708239#CreativeWork/iec_62243_e_2005> ; # IEC 62243(E):2005.
    schema:about <http://id.worldcat.org/fast/918516> ; # Expert systems (Computer science)
    schema:about <http://experiment.worldcat.org/entity/work/data/479708239#Topic/artificial_intelligence_standards> ; # Artificial intelligence--Standards
    schema:alternateName "International Standard ; IEC 62243 ; IEEE 1232" ;
    schema:alternateName "AI-ESTATE" ;
    schema:bookEdition "1st ed. 2005-07." ;
    schema:bookFormat schema:EBook ;
    schema:contributor <http://viaf.org/viaf/133254239> ; # International Electrotechnical Commission. Technical Committee 93.
    schema:contributor <http://viaf.org/viaf/158131501> ; # American National Standards Institute.
    schema:contributor <http://viaf.org/viaf/143405222> ; # IEEE-SA Standards Board.
    schema:contributor <http://viaf.org/viaf/123926298> ; # Institute of Electrical and Electronics Engineers.
    schema:copyrightYear "2005" ;
    schema:datePublished "2005" ;
    schema:description "AI-ESTATE is a set of specifications for data interchange and for standard services for the test and diagnostic environment. The purpose of AI-ESTATE is to standardize interfaces between functional elements of an intelligent diagnostic reasoner and representations of diagnostic knowledge and data for use by such diagnostic reasoners. Formal information models are defined to form the basis for a format to facilitate exchange of persistent diagnostic information between two reasoners and also to provide a formal typing system for diagnostic services. This standard then defines the services to manipulate diagnostic information and to control a diagnostic reasoner."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/479708239> ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/479708239#Series/ieee_std> ; # IEEE std.
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/479708239#Series/international_standard> ; # International standard ;
    schema:name "Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)."@en ;
    schema:productID "217460685" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/217460685#PublicationEvent/geneva_international_electrotechnical_commission_new_york_institute_of_electrical_and_electronics_engineers_2005> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/479708239#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
    schema:publisher <http://experiment.worldcat.org/entity/work/data/479708239#Agent/international_electrotechnical_commission> ; # International Electrotechnical Commission
    schema:url <https://proxy.library.carleton.ca/login?url=https://ieeexplore.ieee.org/servlet/opac?punumber=4463667> ;
    schema:url <http://ieeexplore.ieee.org/servlet/opac?punumber=4463667> ;
    schema:workExample <http://worldcat.org/isbn/9782831880457> ;
    schema:workExample <http://worldcat.org/isbn/9780738147789> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/217460685> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/479708239#Agent/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers
    a bgn:Agent ;
    schema:name "Institute of Electrical and Electronics Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/479708239#Agent/international_electrotechnical_commission> # International Electrotechnical Commission
    a bgn:Agent ;
    schema:name "International Electrotechnical Commission" ;
    .

<http://experiment.worldcat.org/entity/work/data/479708239#CreativeWork/iec_62243_first_edition_2005_07ieee_1232> # IEC 62243 First edition 2005-07IEEE 1232.
    a schema:CreativeWork ;
    schema:name "IEC 62243 First edition 2005-07IEEE 1232." ;
    .

<http://experiment.worldcat.org/entity/work/data/479708239#CreativeWork/ieee_std_1232_e_2002> # IEEE Std. 1232(E):2002.
    a schema:CreativeWork ;
    schema:name "IEEE Std. 1232(E):2002." ;
    .

<http://experiment.worldcat.org/entity/work/data/479708239#Organization/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers.
    a schema:Organization ;
    schema:name "Institute of Electrical and Electronics Engineers." ;
    .

<http://experiment.worldcat.org/entity/work/data/479708239#Series/ieee_std> # IEEE std.
    a bgn:PublicationSeries ;
    schema:creator <http://experiment.worldcat.org/entity/work/data/479708239#Organization/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers.
    schema:hasPart <http://www.worldcat.org/oclc/217460685> ; # Artificial intelligence exchange and service tie to all test environments (AI-ESTATE).
    schema:name "IEEE std." ;
    .

<http://experiment.worldcat.org/entity/work/data/479708239#Series/international_standard> # International standard ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/217460685> ; # Artificial intelligence exchange and service tie to all test environments (AI-ESTATE).
    schema:name "International standard ;" ;
    .

<http://id.worldcat.org/fast/918516> # Expert systems (Computer science)
    a schema:Intangible ;
    schema:name "Expert systems (Computer science)"@en ;
    .

<http://viaf.org/viaf/123926298> # Institute of Electrical and Electronics Engineers.
    a schema:Organization ;
    schema:name "Institute of Electrical and Electronics Engineers." ;
    .

<http://viaf.org/viaf/133254239> # International Electrotechnical Commission. Technical Committee 93.
    a schema:Organization ;
    schema:name "International Electrotechnical Commission. Technical Committee 93." ;
    schema:name "International Electrotechnical Commission." ;
    .

<http://viaf.org/viaf/143405222> # IEEE-SA Standards Board.
    a schema:Organization ;
    schema:name "IEEE-SA Standards Board." ;
    .

<http://viaf.org/viaf/158131501> # American National Standards Institute.
    a schema:Organization ;
    schema:name "American National Standards Institute." ;
    .

<http://worldcat.org/isbn/9780738147789>
    a schema:ProductModel ;
    schema:isbn "0738147788" ;
    schema:isbn "9780738147789" ;
    .

<http://worldcat.org/isbn/9782831880457>
    a schema:ProductModel ;
    schema:isbn "2831880459" ;
    schema:isbn "9782831880457" ;
    .

<http://www.worldcat.org/title/-/oclc/217460685>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/217460685> ; # Artificial intelligence exchange and service tie to all test environments (AI-ESTATE).
    schema:dateModified "2018-08-18" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

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