skip to content

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Additional Physical Format: Online version:
American Society for Testing and Materials. Special Committee on Metric Practice.
ASTM-IEEE standard metric practice.
New York : Institute of Electrical and Electronics Engineers, 1976
(OCoLC)894786181
Document Type: Book
All Authors / Contributors: American Society for Testing and Materials. Special Committee on Metric Practice.; American Society for Testing and Materials.; Institute of Electrical and Electronics Engineers.; Institute of Electrical and Electronics Engineers. Standards Coordinating Committee 14 on Quantities and Units.
OCLC Number: 4761832
Notes: At head of title: ASTM E380-75; supersedes ASTM E380-1974, IEEE Std 268-1973, IEEE Std 322-1971.
Joint sponsors: The American Society for Testing and Materials, The Institute of Electrical and Electronics Engineers.
Description: 47 pages : illustrations ; 28 cm.
Series Title: Institute of Electrical and Electronics Engineers.; IEEE standard
Responsibility: [developed cooperatively with the ASTM Special Committee on Metric Practice and the IEEE Standards Coordinating Committee on Quantities and Units].

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/4761832> # ASTM-IEEE standard metric practice
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "4761832" ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/14990334#Topic/weights_and_measures_standards> ; # Weights and Measures--standards
    schema:about <http://experiment.worldcat.org/entity/work/data/14990334#Topic/metric_system> ; # Metric system
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/123926298> ; # Institute of Electrical and Electronics Engineers. Standards Coordinating Committee 14 on Quantities and Units.
    schema:contributor <http://viaf.org/viaf/147081590> ; # American Society for Testing and Materials.
    schema:creator <http://viaf.org/viaf/147081590> ; # American Society for Testing and Materials.
    schema:datePublished "1976" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/14990334> ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/14990334#Series/ieee_standard> ; # IEEE standard ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/14990334#Series/ieee_std> ; # IEEE Std ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/894786181> ;
    schema:name "ASTM-IEEE standard metric practice"@en ;
    schema:productID "4761832" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/4761832#PublicationEvent/new_york_institute_of_electrical_and_electronics_engineers_1976> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/14990334#Agent/institute_of_electrical_and_electronics_engineers> ; # Institute of Electrical and Electronics Engineers
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/4761832> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/14990334#Agent/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers
    a bgn:Agent ;
    schema:name "Institute of Electrical and Electronics Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/14990334#Organization/institute_of_electrical_and_electronics_engineers> # Institute of Electrical and Electronics Engineers.
    a schema:Organization ;
    schema:name "Institute of Electrical and Electronics Engineers." ;
    .

<http://experiment.worldcat.org/entity/work/data/14990334#Series/ieee_std> # IEEE Std ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/4761832> ; # ASTM-IEEE standard metric practice
    schema:name "IEEE Std ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/14990334#Topic/weights_and_measures_standards> # Weights and Measures--standards
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh85145963> ;
    schema:name "Weights and Measures--standards"@en ;
    schema:name "Weights and measures--Standards"@en ;
    .

<http://viaf.org/viaf/123926298> # Institute of Electrical and Electronics Engineers. Standards Coordinating Committee 14 on Quantities and Units.
    a schema:Organization ;
    schema:name "Institute of Electrical and Electronics Engineers. Standards Coordinating Committee 14 on Quantities and Units." ;
    schema:name "Institute of Electrical and Electronics Engineers." ;
    .

<http://viaf.org/viaf/147081590> # American Society for Testing and Materials.
    a schema:Organization ;
    schema:name "American Society for Testing and Materials." ;
    schema:name "American Society for Testing and Materials. Special Committee on Metric Practice." ;
    .

<http://www.worldcat.org/oclc/894786181>
    a schema:CreativeWork ;
    rdfs:label "ASTM-IEEE standard metric practice." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/4761832> ; # ASTM-IEEE standard metric practice
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.