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Atom-probe field ion microscopy : field ion emission and surfaces and interfaces at atomic resolution

Author: Tien Tsou Tsong
Publisher: Cambridge ; New York : Cambridge University Press, 1990.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Tien Tsou Tsong
ISBN: 0521363799 9780521363792 0521019931 9780521019934
OCLC Number: 23015584
Description: x, 387 pages : illustrations ; 24 cm
Contents: Preface; 1. Introduction; 2. Field ion emission; 3. Instrumentations and techniques; 4. Applications to surface science; Selected topics in applications; References; Index.
Responsibility: Tien T. Tsong.
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