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Atomic force microscopy

Author: Peter Eaton; Paul West
Publisher: Oxford Oxford Univ. Press 2010
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Peter Eaton; Paul West
ISBN: 0199570450 9780199570454
OCLC Number: 845617147
Notes: Literaturverz. S. [201] - 240
Description: VIII, 248 Seiten Illustrationen, Diagramme 25 cm
Contents: 1. Introduction ; 2. Instrumental Aspects of AFM ; 3. AFM Modes ; 4. Measuring AFM Images ; 5. Image Processing in AFM ; 6. Image Artifacts in AFM ; 7. Applications of AFM ; Appendix 1: AFM Standards and Calibration Specimens ; Appendix 2: AFM Software
Responsibility: Peter Eaton; Paul West
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I recommend this book to any reader who wants to enter the world of force microscopy. This book is easy to read, entertaining, with a practical approach. * Carmen Serra, Nanotechnology and Surface Read more...

 
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