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Atomic force microscopy

Author: Peter Jonathan Eaton; Paul West
Publisher: Oxford ; New York : Oxford University Press, 2014. ©2010
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Summary:
Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.
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Document Type: Book
All Authors / Contributors: Peter Jonathan Eaton; Paul West
ISBN: 9780199570454 0199570450
OCLC Number: 947881455
Notes: "First published 2010. Reprinted 2011 twice, 2013, 2014"--Title page verso.
Description: viii, 248 pages, 4 unnumbered pages of plates : illustrations (some color) ; 26 cm
Contents: Introduction --
AFM instrumentation --
AMF modes --
Measuring AFM images --
AFM image processing and analysis --
AFM image artefacts --
Applications of AFM.
Responsibility: Peter Eaton, Paul West.

Abstract:

Atomic force microscopes are very important tools for the advancement of science and technology. This book provides an introduction to the microscopes so that scientists and engineers can learn both how to use them, and what they can do.

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