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Atomic force microscopy/scanning tunneling microscopy 3

Author: Samuel H Cohen; Marcia L Lightbody; Foundation for Advances in Medicine and Science.
Publisher: New York : Kluwer Academic/Plenum Publishers, ©1999.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Summary:

The Foundation for Advances in Medicine and Science (FAMS), the organizers of SCANNING 98, sponsored its third annual Atomic Force Microscopy/Scanning Tunneling Microscopy Symposium at the Omni Inner  Read more...

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Genre/Form: Conference papers and proceedings
Baltimore (Md., 1998)
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Samuel H Cohen; Marcia L Lightbody; Foundation for Advances in Medicine and Science.
ISBN: 0306462974 9780306462979
OCLC Number: 42649748
Notes: "Proceedings of the Third Symposium on Atomic Force/Scanning Tunneling Microscopy, sponsored by the Foundation for Advances in Medicine and Science, held May 9-12, 1998, in Baltimore, Maryland"--Title page verso.
Description: viii, 210 pages : illustrations ; 26 cm
Contents: A practical approach to understanding surface metrology and its applications / Christopher A. Brown --
Aplications of scanning probe microscopy in aterials sciences: examples of surface modification and quantitative analysis / Peter von Blanckenhagen --
Scanning probe microscopy in biology with potential applications in forensics / James Vesenka and Emily Morales --
Atomic manipulation of hydrogen on hydrogen-terminated silicon surfaces with scanning tunneling microscope / D.H. Huang and Y. Yamamoto --
Appolo 11 lunar samples: an examination using tapping mode atomic force microscopy and other microscope methods / Ernest C. Hammond [and others] --
Novel micromachined cantilever sensors for scanning near-field microscopy / W. Scholz [and others] --
Imaging of cell surface structure by scanning probe microscopy / V.A. Fedirko [and others] --
A force limitation for successful observation of atomic defects: defect trapping of the atomic force microscopy tip / I. Yu. Sokolov, G.S. Henderson, and F.J. Wicks --
A new approach to examine interfacial interaction polential between a thin solid film or a droplet and a smooth substrate / R. Mu [and others] --
Nanometer-scale patterning of surfaces using self-assembly chemistry: 1. Preliminary studies of polyniline electrodeposition on self-assembled mixed monolayers / William A. Hayes and Curtis Shannon --
Local rate of electroless copper deposition by scanning tunneling microscopy / C.J. Weber, H.W. Pickering, and K.G. Weil --
Atomic force microscopy of olivine / Cynthia Eilson, Tera Muir, and James Vesenka --
The study of sublimation rates and nucleation and growth of TNT and PETN on silica and graphite surfaces by optical and atomic force microscopy and ellipsometry / Y.S. Tung [and others] --
Peculiarities of the scanning tunneling microscopy probe on porous gallium phosphide / V.M. Ichizli [and others] --
Influence of doping concentration on the etching rate of GaAs studied by atomic force microscopy / R.S. Freitas [and others] --
Comparative scanning tunneling microscopy studies of CoFe2O4 nanoparticles of ferrofluids in acidic medium / Dalin Dai [and others] --
From laboratory measurements to the first in-situ analysis of pristine cometary grains / J. Romstedt [and others] --
Synthesis of prebiotic peptides and oligonucleotides on clay mineral surfaces: a scanning force microscopy study / T.L. Porter [and others] --
Surface structure and intercalative polymerization studies of smectite clay thin films / T.L. Porter [and others] --
Atomic force microscopy--a new and complementary tool in asphalt research compared to scanning electron microscopy / L. Loeber [and others].
Responsibility: edited by Samuel H. Cohen and Marcia L. Lightbody.
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