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ATS 2003 : 12th Asian Test Symposium : proceedings : 16-190 November, 2003, Xiʻan, China

Author: IEEE Computer Society. Test Technology Technical Committee.; Chinai Jōhō Tsūshin Gakkai (Japan). Technical Group on Dependable Computing.; Guo jia zi ran ke xue ji jin wei yuan hui (China)
Publisher: Los Alamitos, Calif. : IEEE Computer Society, ©2003.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
Summary:

Papers from a November 2003 symposium present the latest ideas in the field of testing, in areas including design for testability, enhanced delay testing and ATPG, test power, software testing, fault  Read more...

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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: IEEE Computer Society. Test Technology Technical Committee.; Chinai Jōhō Tsūshin Gakkai (Japan). Technical Group on Dependable Computing.; Guo jia zi ran ke xue ji jin wei yuan hui (China)
ISBN: 0769519512 9780769519517
OCLC Number: 53865411
Notes: "IEEE Computer Society Order Number PR01951"--Title page verso.
Description: xxi, 513 pages : illustrations ; 28 cm
Other Titles: Test Symposium, 2003, ATS 2003, 12th Asian.
Proceedings, 12th Asian Test Symposium
12th Asian Test Symposium
Responsibility: sponsored by the Test Technology Technical Council of IEEE Computer Society ; in cooperation with Technical Group on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC).

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