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Basic business statistics : concepts and applications

Author: Mark L Berenson; David M Levine
Publisher: Upper Saddle River, N.J. : Prentice-Hall, ©1999.
Edition/Format:   Print book : CD for computer : Document   Computer File : English : 7th edView all editions and formats
Summary:

Intended for a one- or two-term course in Business Statistics at the undergraduate or graduate level. This text focuses on concepts and applications of statistics to the functional areas of business  Read more...

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Details

Material Type: Document, Internet resource
Document Type: Book, Computer File, Internet Resource
All Authors / Contributors: Mark L Berenson; David M Levine
ISBN: 0137956185 9780137956180 0130812544 9780130812544
OCLC Number: 39671103
Notes: Includes index.
Description: xxvi, 1058, [56] pages : illustrations (some color) ; 26 cm + 1 computer optical disc (4 3/4 in.)
Details: System requirements: Microsoft Excel; Minitab.
Contents: Ch. 1. Introduction and Data Collection --
Supplement: Using Microsoft Excel for Statistical Analysis --
Ch. 2. Presenting Data in Tables and Charts --
Ch. 3. Summarizing and Describing Numerical Data --
Ch. 4. Basic Probability and Discrete Probability Distributions --
Ch. 5. Decision Making --
Ch. 6. The Normal Distribution and Sampling Distributions --
Ch. 7. Confidence Interval Estimation --
Ch. 8. Fundamentals of Hypothesis Testing: One-Sample Tests --
Ch. 9. Two-Sample Tests with Numerical Data --
Ch. 10. ANOVA and Other c-Sample Tests with Numerical Data --
Ch. 11. Two-Sample and c-Sample Tests with Categorical Data --
Ch. 12. Statistical Applications in Quality and Productivity Management --
Ch. 13. Simple Linear Regression and Correlation --
Ch. 14. Multiple Regression Models --
Ch. 15. Time-Series Analysis --
Answers to Selected Problems --
App. A. Review of Arithmetic and Algebra --
App. B. Summation Notation --
App. C. Statistical Symbols and Greek Alphabet --
App. D Special Data Set --
App. E Tables --
App. F Documentation for CD-ROM Files --
Index --
Excel Index.
Responsibility: Mark L. Berenson, David M. Levine.

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