skip to content
Bayesian inference and maximum entropy methods in science and engineering : 22nd International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering, Moscow, Idaho, 3-7 August 2002 Preview this item
ClosePreview this item
Checking...

Bayesian inference and maximum entropy methods in science and engineering : 22nd International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering, Moscow, Idaho, 3-7 August 2002

Author: Christopher J Williams, Ph. D.; University of Idaho. Division of Statistics.; Jaynes' Foundation.
Publisher: Melville, N.Y. : American Institute of Physics, 2003.
Series: AIP conference proceedings, no. 659.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering (22nd : 2002 : Moscow, Idaho).
Bayesian inference and maximum entropy methods in science and engineering.
Melville, N.Y. : American Institute of Physics, 2003
(OCoLC)654665354
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Christopher J Williams, Ph. D.; University of Idaho. Division of Statistics.; Jaynes' Foundation.
ISBN: 0735401195 9780735401198
OCLC Number: 52101581
Description: xiii, 410 p. : ill. ; 25 cm.
Series Title: AIP conference proceedings, no. 659.
Responsibility: editor, Christopher J. Williams ; sponsoring organizations, University of Idaho, Division of Statistics, the Edwin T. Jaynes International Center for Bayesian Methods and Maximum Entropy.
More information:

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/52101581> # Bayesian inference and maximum entropy methods in science and engineering : 22nd International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering, Moscow, Idaho, 3-7 August 2002
    a schema:Book, schema:CreativeWork ;
    library:oclcnum "52101581" ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/203183519#Place/melville_n_y> ; # Melville, N.Y.
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/203183519#Topic/maximum_entropy_method> ; # Maximum entropy method
    schema:about <http://id.worldcat.org/fast/829022> ; # Bayesian statistical decision theory--Industrial applications
    schema:about <http://dewey.info/class/519.542/e22/> ;
    schema:about <http://id.worldcat.org/fast/829019> ; # Bayesian statistical decision theory
    schema:about <http://id.worldcat.org/fast/1012668> ; # Maximum entropy method
    schema:about <http://experiment.worldcat.org/entity/work/data/203183519#Topic/bayesian_statistical_decision_theory_industrial_applications> ; # Bayesian statistical decision theory--Industrial applications
    schema:bookFormat bgn:PrintBook ;
    schema:contributor <http://viaf.org/viaf/123350991> ; # Jaynes' Foundation.
    schema:contributor <http://experiment.worldcat.org/entity/work/data/203183519#Person/williams_christopher_j_ph_d> ; # Ph. D. Christopher J. Williams
    schema:contributor <http://viaf.org/viaf/124321963> ; # University of Idaho. Division of Statistics.
    schema:creator <http://experiment.worldcat.org/entity/work/data/203183519#Meeting/international_workshop_on_bayesian_inference_and_maximum_entropy_methods_in_science_and_engineering_22nd_2002_moscow_idaho> ; # International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering (22nd : 2002 : Moscow, Idaho)
    schema:datePublished "2003" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/203183519> ;
    schema:genre "Conference publication"@en ;
    schema:genre "Conference papers and proceedings"@en ;
    schema:inLanguage "en" ;
    schema:isPartOf <http://experiment.worldcat.org/entity/work/data/203183519#Series/aip_conference_proceedings> ; # AIP conference proceedings ;
    schema:isPartOf <http://worldcat.org/issn/0094-243X> ; # AIP conference proceedings,
    schema:isSimilarTo <http://www.worldcat.org/oclc/654665354> ;
    schema:name "Bayesian inference and maximum entropy methods in science and engineering : 22nd International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering, Moscow, Idaho, 3-7 August 2002"@en ;
    schema:numberOfPages "410" ;
    schema:productID "52101581" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/52101581#PublicationEvent/melville_n_y_american_institute_of_physics_2003> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/203183519#Agent/american_institute_of_physics> ; # American Institute of Physics
    schema:workExample <http://worldcat.org/isbn/9780735401198> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/52101581> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/203183519#Agent/american_institute_of_physics> # American Institute of Physics
    a bgn:Agent ;
    schema:name "American Institute of Physics" ;
    .

<http://experiment.worldcat.org/entity/work/data/203183519#Meeting/international_workshop_on_bayesian_inference_and_maximum_entropy_methods_in_science_and_engineering_22nd_2002_moscow_idaho> # International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering (22nd : 2002 : Moscow, Idaho)
    a bgn:Meeting, schema:Event ;
    schema:location <http://experiment.worldcat.org/entity/work/data/203183519#Place/moscow_idaho> ; # Moscow, Idaho)
    schema:name "International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering (22nd : 2002 : Moscow, Idaho)" ;
    .

<http://experiment.worldcat.org/entity/work/data/203183519#Person/williams_christopher_j_ph_d> # Ph. D. Christopher J. Williams
    a schema:Person ;
    schema:familyName "Williams" ;
    schema:givenName "Christopher J." ;
    schema:name "Ph. D. Christopher J. Williams" ;
    .

<http://experiment.worldcat.org/entity/work/data/203183519#Place/melville_n_y> # Melville, N.Y.
    a schema:Place ;
    schema:name "Melville, N.Y." ;
    .

<http://experiment.worldcat.org/entity/work/data/203183519#Place/moscow_idaho> # Moscow, Idaho)
    a schema:Place ;
    schema:name "Moscow, Idaho)" ;
    .

<http://experiment.worldcat.org/entity/work/data/203183519#Series/aip_conference_proceedings> # AIP conference proceedings ;
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/52101581> ; # Bayesian inference and maximum entropy methods in science and engineering : 22nd International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering, Moscow, Idaho, 3-7 August 2002
    schema:name "AIP conference proceedings ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/203183519#Topic/bayesian_statistical_decision_theory_industrial_applications> # Bayesian statistical decision theory--Industrial applications
    a schema:Intangible ;
    schema:hasPart <http://id.loc.gov/authorities/subjects/sh85012506> ;
    schema:name "Bayesian statistical decision theory--Industrial applications"@en ;
    .

<http://id.worldcat.org/fast/1012668> # Maximum entropy method
    a schema:Intangible ;
    schema:name "Maximum entropy method"@en ;
    .

<http://id.worldcat.org/fast/829019> # Bayesian statistical decision theory
    a schema:Intangible ;
    schema:name "Bayesian statistical decision theory"@en ;
    .

<http://id.worldcat.org/fast/829022> # Bayesian statistical decision theory--Industrial applications
    a schema:Intangible ;
    schema:name "Bayesian statistical decision theory--Industrial applications"@en ;
    .

<http://viaf.org/viaf/123350991> # Jaynes' Foundation.
    a schema:Organization ;
    schema:name "Jaynes' Foundation." ;
    .

<http://viaf.org/viaf/124321963> # University of Idaho. Division of Statistics.
    a schema:Organization ;
    schema:name "University of Idaho. Division of Statistics." ;
    .

<http://worldcat.org/isbn/9780735401198>
    a schema:ProductModel ;
    schema:isbn "0735401195" ;
    schema:isbn "9780735401198" ;
    .

<http://worldcat.org/issn/0094-243X> # AIP conference proceedings,
    a bgn:PublicationSeries ;
    schema:hasPart <http://www.worldcat.org/oclc/52101581> ; # Bayesian inference and maximum entropy methods in science and engineering : 22nd International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering, Moscow, Idaho, 3-7 August 2002
    schema:issn "0094-243X" ;
    schema:name "AIP conference proceedings," ;
    .

<http://www.worldcat.org/oclc/654665354>
    a schema:CreativeWork ;
    rdfs:label "Bayesian inference and maximum entropy methods in science and engineering." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/52101581> ; # Bayesian inference and maximum entropy methods in science and engineering : 22nd International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering, Moscow, Idaho, 3-7 August 2002
    .

<http://www.worldcat.org/title/-/oclc/52101581>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
    schema:about <http://www.worldcat.org/oclc/52101581> ; # Bayesian inference and maximum entropy methods in science and engineering : 22nd International Workshop on Bayesian Inference and Maximum Entropy Methods in Science and Engineering, Moscow, Idaho, 3-7 August 2002
    schema:dateModified "2016-11-12" ;
    void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.