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BIOS integrity measurements guidelines (draft) : recommendations of the National Institute of Standards and Technology

Author: Andrew Regenscheid; Karen Kent; National Institute of Standards and Technology (U.S.)
Publisher: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, [2011]
Series: NIST special publication, 800-155.; NIST special publication., Computer security.
Edition/Format:   eBook : Document : National government publication : English : Draft
Database:WorldCat
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Material Type: Document, Government publication, National government publication, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Andrew Regenscheid; Karen Kent; National Institute of Standards and Technology (U.S.)
OCLC Number: 816340199
Notes: Title from PDF title screen (viewed Sept. 27, 2012).
"December 2011."
Description: 1 online resource (vi, 40 pages) : illustrations.
Series Title: NIST special publication, 800-155.; NIST special publication., Computer security.
Other Titles: Basic Input/Output System integrity measurements guidelines (draft)
Responsibility: Andrew Regenscheid, Karen Scarfone.

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