skip to content
Burn-in testing : its quantification and optimization Preview this item
ClosePreview this item
Checking...

Burn-in testing : its quantification and optimization

Author: Dimitri Kececioglu; Feng-bin Sun
Publisher: Upper Saddle River, N.J. : Prentice Hall PTR, ©1997.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Additional Physical Format: Online version:
Kececioglu, Dimitri.
Burn-in testing.
Upper Saddle River, N.J. : Prentice Hall PTR, ©1997
(OCoLC)644244267
Document Type: Book
All Authors / Contributors: Dimitri Kececioglu; Feng-bin Sun
ISBN: 0133242110 9780133242119
OCLC Number: 36727551
Description: xxviii, 668 pages : illustrations ; 24 cm.
Responsibility: Dimitri Kececioglu, Feng-Bin Sun.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

All user tags (1)

View most popular tags as: tag list | tag cloud

  • EL  (by 1 person)
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/36727551> # Burn-in testing : its quantification and optimization
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "36727551" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/593011#Place/upper_saddle_river_n_j> ; # Upper Saddle River, N.J.
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/593011#Topic/electronic_apparatus_and_appliances_testing> ; # Electronic apparatus and appliances--Testing
   schema:about <http://id.loc.gov/authorities/subjects/sh85042269> ; # Electronic apparatus and appliances--Testing
   schema:about <http://experiment.worldcat.org/entity/work/data/593011#Topic/duree_de_vie_ingenierie_essais> ; # Durée de vie (ingénierie)--Essais
   schema:about <http://id.worldcat.org/fast/906837> ; # Electronic apparatus and appliances--Testing
   schema:about <http://dewey.info/class/621.381548/e21/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/593011#Topic/environmental_testing> ; # Environmental testing
   schema:about <http://id.worldcat.org/fast/913532> ; # Environmental testing
   schema:about <http://experiment.worldcat.org/entity/work/data/593011#Topic/essais_acceleres_technologie> ; # Essais accélérés (technologie)
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/55855358> ; # Feng-bin Sun
   schema:copyrightYear "1997" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/593011#Person/kececioglu_dimitri> ; # Dimitri Kececioglu
   schema:datePublished "1997" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/593011> ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/593011#Series/reliability_engineering> ; # Reliability engineering
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/593011#Series/reliability_series> ; # Reliability series.
   schema:isSimilarTo <http://www.worldcat.org/oclc/644244267> ;
   schema:name "Burn-in testing : its quantification and optimization"@en ;
   schema:productID "36727551" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/36727551#PublicationEvent/upper_saddle_river_n_j_prentice_hall_ptr_1997> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/593011#Agent/prentice_hall_ptr> ; # Prentice Hall PTR
   schema:workExample <http://worldcat.org/isbn/9780133242119> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/36727551> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/593011#Agent/prentice_hall_ptr> # Prentice Hall PTR
    a bgn:Agent ;
   schema:name "Prentice Hall PTR" ;
    .

<http://experiment.worldcat.org/entity/work/data/593011#Person/kececioglu_dimitri> # Dimitri Kececioglu
    a schema:Person ;
   schema:familyName "Kececioglu" ;
   schema:givenName "Dimitri" ;
   schema:name "Dimitri Kececioglu" ;
    .

<http://experiment.worldcat.org/entity/work/data/593011#Place/upper_saddle_river_n_j> # Upper Saddle River, N.J.
    a schema:Place ;
   schema:name "Upper Saddle River, N.J." ;
    .

<http://experiment.worldcat.org/entity/work/data/593011#Series/reliability_engineering> # Reliability engineering
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/36727551> ; # Burn-in testing : its quantification and optimization
   schema:name "Reliability engineering" ;
    .

<http://experiment.worldcat.org/entity/work/data/593011#Series/reliability_series> # Reliability series.
    a bgn:PublicationSeries ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/593011#Person/kececioglu_dimitri> ; # Dimitri Kececioglu
   schema:hasPart <http://www.worldcat.org/oclc/36727551> ; # Burn-in testing : its quantification and optimization
   schema:name "Reliability series." ;
    .

<http://experiment.worldcat.org/entity/work/data/593011#Topic/duree_de_vie_ingenierie_essais> # Durée de vie (ingénierie)--Essais
    a schema:Intangible ;
   schema:name "Durée de vie (ingénierie)--Essais"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/593011#Topic/electronic_apparatus_and_appliances_testing> # Electronic apparatus and appliances--Testing
    a schema:Intangible ;
   schema:name "Electronic apparatus and appliances--Testing"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/593011#Topic/environmental_testing> # Environmental testing
    a schema:Intangible ;
   schema:name "Environmental testing"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/593011#Topic/essais_acceleres_technologie> # Essais accélérés (technologie)
    a schema:Intangible ;
   schema:name "Essais accélérés (technologie)"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85042269> # Electronic apparatus and appliances--Testing
    a schema:Intangible ;
   schema:name "Electronic apparatus and appliances--Testing"@en ;
    .

<http://id.worldcat.org/fast/906837> # Electronic apparatus and appliances--Testing
    a schema:Intangible ;
   schema:name "Electronic apparatus and appliances--Testing"@en ;
    .

<http://id.worldcat.org/fast/913532> # Environmental testing
    a schema:Intangible ;
   schema:name "Environmental testing"@en ;
    .

<http://viaf.org/viaf/55855358> # Feng-bin Sun
    a schema:Person ;
   schema:familyName "Sun" ;
   schema:givenName "Feng-bin" ;
   schema:name "Feng-bin Sun" ;
    .

<http://worldcat.org/isbn/9780133242119>
    a schema:ProductModel ;
   schema:isbn "0133242110" ;
   schema:isbn "9780133242119" ;
    .

<http://www.worldcat.org/oclc/644244267>
    a schema:CreativeWork ;
   rdfs:label "Burn-in testing." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/36727551> ; # Burn-in testing : its quantification and optimization
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.