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Characterization of organic thin films

Author: Yale Strausser; G E McGuire; C Richard Brundle; Charles A Evans
Publisher: New York, NY : Momentum Press, 2010.
Series: Materials characterization series.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
Materials science is at the center of academic and industrial research today. In the past ten years, it has become apparent that the way materials scientists operate should change, and that a design approach must be used in the preparation of new materials. This is best represented by the research done in the area of organic thin films, where a useful property is identified a priori, an appropriate molecule designed  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Characterization of organic thin films.
New York : Momentum Press, 2010
(OCoLC)607476958
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Yale Strausser; G E McGuire; C Richard Brundle; Charles A Evans
ISBN: 1606500449 9781606500446
OCLC Number: 752976150
Notes: "First published by Butterworth-Heinemann in 1995 ... Reissued volume published in 2010 by Momentum Press"--Title page verso.
Description: 1 online resource (xvii, 276 pages) : illustrations.
Contents: Langmuir-Blodgett films / George L. Gaines --
Self-assembled monolayers / Abraham Ulman --
Spectroscopic ellipsometry / Robert W. Collins [and others] --
Infrared spectroscopy in the characterization of organic thin films / David L. Allara --
Raman spectroscopic characterization of organic thin films / Jeanne E. Pemberton --
Surface potential / Stephen D. Evans --
X-ray diffraction / P. Dutta --
High resolution EELS studies of organic thin films and surfaces / Lawrence H. Dubois --
Wetting / D. Li and A.W. Neumann --
Secondary ion mass spectrometry as applied to thin organic and polymeric films / Jian-Xin Li [and others] --
X-ray photoelectron spectroscopy of organic thin films / Abraham Ulman and James F. Elfman --
Molecular orientation in thin films as probed by optical second harmonic generation / Robert M. Corn and Daniel A. Higgins.
Series Title: Materials characterization series.
Responsibility: editors, Yale Strausser and Gary E. McGuire ; series editors, C. Richard Brundle and Charles A. Evans.
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Abstract:

Based upon organic materials are at the heart of much of the revolution in modern technology, from advanced electronics, to optics to sensors to biomedical engineering, this volume introduces the  Read more...

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