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Characterization of silicon surfaces by the electron energy loss spectrum.

Author: P S P Wei; BOEING SCIENTIFIC RESEARCH LABS SEATTLE WASH.
Publisher: Ft. Belvoir Defense Technical Information Center JUN 1970.
Edition/Format:   Book : English
Database:WorldCat
Summary:
The energy loss spectra of silicon during several stages of the cleaning treatment have been studied in a LEED apparatus. A layer of beta-SiC formed on the silicon surface is detected. The results suggest that the energy loss spectrum is sensitive to the change in chemical composition and electronic structure of the solid surface. (Author).
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Document Type: Book
All Authors / Contributors: P S P Wei; BOEING SCIENTIFIC RESEARCH LABS SEATTLE WASH.
OCLC Number: 227596292
Description: 9 p.

Abstract:

The energy loss spectra of silicon during several stages of the cleaning treatment have been studied in a LEED apparatus. A layer of beta-SiC formed on the silicon surface is detected. The results suggest that the energy loss spectrum is sensitive to the change in chemical composition and electronic structure of the solid surface. (Author).

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<http://www.worldcat.org/oclc/227596292>
library:oclcnum"227596292"
library:placeOfPublication
library:placeOfPublication
owl:sameAs<info:oclcnum/227596292>
rdf:typeschema:Book
schema:about
schema:about
schema:about
schema:about
schema:about
schema:contributor
schema:contributor
schema:datePublished"JUN 1970"
schema:datePublished"1970"
schema:description"The energy loss spectra of silicon during several stages of the cleaning treatment have been studied in a LEED apparatus. A layer of beta-SiC formed on the silicon surface is detected. The results suggest that the energy loss spectrum is sensitive to the change in chemical composition and electronic structure of the solid surface. (Author)."@en
schema:exampleOfWork<http://worldcat.org/entity/work/id/137301553>
schema:inLanguage"en"
schema:name"Characterization of silicon surfaces by the electron energy loss spectrum."@en
schema:numberOfPages"9"
schema:publisher
schema:url

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