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Charge collection studies on integrated circuit test structures using heavy-ion microbeams and MEDICI simulation calculations

Author: Baonian Guo
Publisher: 2000.
Dissertation: Ph. D. University of North Texas 2000
Edition/Format:   Thesis/dissertation : Document : Thesis/dissertation   Computer File : English
Database:WorldCat
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Material Type: Document, Thesis/dissertation
Document Type: Book, Computer File
All Authors / Contributors: Baonian Guo
OCLC Number: 47169630
Notes: Title from title page display.
Details: Mode of access: Internet, via World Wide Web.; System requirements: Adobe Acrobat Reader.
Responsibility: Baonian Guo.
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