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Charge transport and storage in metal-nitride-oxide-silicon (MNOS) structures and its memory applications.

Author: Dov Frohman-Bentchkowsky
Publisher: 1969.
Dissertation: Ph. D. in Engineering University of California, Berkeley 1969
Edition/Format:   Thesis/dissertation : Thesis/dissertation : Manuscript   Archival Material : English
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Material Type: Thesis/dissertation, Manuscript
Document Type: Book, Archival Material
All Authors / Contributors: Dov Frohman-Bentchkowsky
OCLC Number: 20214296
Description: 65 leaves illustrations

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