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Charged particle traps. II : applications

Auteur : G Werth; V N Gheorghe; F G Major
Éditeur: Berlin : Springer, ©2009.
Collection: Springer series on atomic, optical, and plasma physics, 54.
Édition/format:   Livre électronique : Document : AnglaisVoir toutes les éditions et tous les formats
Source:Charged particle traps
Résumé:
This, the second volume of Charged Particle Traps, is devoted to applications, complementing the first volume{u2019}s comprehensive treatment of the theory and practice of charged particle traps, their many variants and refinements. In recent years, applications of far reaching importance have emerged ranging from the ultra-precise mass determinations of elementary particles and their antiparticles and short-lived  Lire la suite...
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Détails

Genre/forme: Electronic books
Format – détails additionnels: Print version:
Werth, G. (Günter), 1938-
Charged particle traps II.
Berlin : Springer, ©2009
(DLC) 2009929168
(OCoLC)308158133
Type d’ouvrage: Document, Ressource Internet
Type de document: Ressource Internet, Fichier d'ordinateur
Tous les auteurs / collaborateurs: G Werth; V N Gheorghe; F G Major
ISBN: 9783540922612 354092261X
Numéro OCLC: 489216223
Description: 1 online resource (x, 275 pages) : illustrations.
Contenu: Part I: Electromagnetic Trap Properties --
1. Summary of Trap Properties --
Part II: Mass Spectrometry --
2. Mass Spectrometry in Paul Traps --
3. Mass Spectrometry in Penning Traps --
Part III: Spectroscopy with Trapped Charged Particles --
4. Microwave Spectroscopy --
5. Optical Spectroscopy --
6. Collision Studies in Traps --
Part IV: Quantum Topics --
7. Quantum Effects in Charged Particle Traps --
8. Quantum Computing with Trapped Charged Particles.
Titre de collection: Springer series on atomic, optical, and plasma physics, 54.
Responsabilité: G. Werth, V.N. Gheorghe, F.G. Major.

Résumé:

Here is the second volume of this publication, devoted to the applications of this technology, and complementing the first volume's comprehensive treatment of the theory and practice of charged  Lire la suite...

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