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Charged particle traps. II : applications

Autore: G Werth; V N Gheorghe; F G Major
Editore: Berlin : Springer, ©2009.
Serie: Springer series on atomic, optical, and plasma physics, 54.
Edizione/Formato:   eBook : Document : EnglishVedi tutte le edizioni e i formati
Pubblicazione:Charged particle traps
Banca dati:WorldCat
Sommario:
This, the second volume of Charged Particle Traps, is devoted to applications, complementing the first volume{u2019}s comprehensive treatment of the theory and practice of charged particle traps, their many variants and refinements. In recent years, applications of far reaching importance have emerged ranging from the ultra-precise mass determinations of elementary particles and their antiparticles and short-lived  Per saperne di più…
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Genere/forma: Electronic books
Informazioni aggiuntive sul formato: Print version:
Werth, G. (Günter), 1938-
Charged particle traps II.
Berlin : Springer, ©2009
(DLC) 2009929168
(OCoLC)308158133
Tipo materiale: Document, Risorsa internet
Tipo documento: Internet Resource, Computer File
Tutti gli autori / Collaboratori: G Werth; V N Gheorghe; F G Major
ISBN: 9783540922612 354092261X
Numero OCLC: 489216223
Descrizione: 1 online resource (x, 275 pages) : illustrations.
Contenuti: Part I: Electromagnetic Trap Properties --
1. Summary of Trap Properties --
Part II: Mass Spectrometry --
2. Mass Spectrometry in Paul Traps --
3. Mass Spectrometry in Penning Traps --
Part III: Spectroscopy with Trapped Charged Particles --
4. Microwave Spectroscopy --
5. Optical Spectroscopy --
6. Collision Studies in Traps --
Part IV: Quantum Topics --
7. Quantum Effects in Charged Particle Traps --
8. Quantum Computing with Trapped Charged Particles.
Titolo della serie: Springer series on atomic, optical, and plasma physics, 54.
Responsabilità: G. Werth, V.N. Gheorghe, F.G. Major.
Maggiori informazioni:

Abstract:

Here is the second volume of this publication, devoted to the applications of this technology, and complementing the first volume's comprehensive treatment of the theory and practice of charged  Per saperne di più…

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