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Charged particle traps. II : applications

Autor: G Werth; V N Gheorghe; F G Major
Editora: Berlin : Springer, ©2009.
Séries: Springer series on atomic, optical, and plasma physics, 54.
Edição/Formato   e-book : Documento : InglêsVer todas as edições e formatos
Publicação:Charged particle traps
Base de Dados:WorldCat
Resumo:
This, the second volume of Charged Particle Traps, is devoted to applications, complementing the first volume{u2019}s comprehensive treatment of the theory and practice of charged particle traps, their many variants and refinements. In recent years, applications of far reaching importance have emerged ranging from the ultra-precise mass determinations of elementary particles and their antiparticles and short-lived  Ler mais...
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Detalhes

Gênero/Forma: Electronic books
Formato Físico Adicional: Print version:
Werth, G. (Günter), 1938-
Charged particle traps II.
Berlin : Springer, ©2009
(DLC) 2009929168
(OCoLC)308158133
Tipo de Material: Documento, Recurso Internet
Tipo de Documento: Recurso Internet, Arquivo de Computador
Todos os Autores / Contribuintes: G Werth; V N Gheorghe; F G Major
ISBN: 9783540922612 354092261X
Número OCLC: 489216223
Descrição: 1 online resource (x, 275 pages) : illustrations.
Conteúdos: Part I: Electromagnetic Trap Properties --
1. Summary of Trap Properties --
Part II: Mass Spectrometry --
2. Mass Spectrometry in Paul Traps --
3. Mass Spectrometry in Penning Traps --
Part III: Spectroscopy with Trapped Charged Particles --
4. Microwave Spectroscopy --
5. Optical Spectroscopy --
6. Collision Studies in Traps --
Part IV: Quantum Topics --
7. Quantum Effects in Charged Particle Traps --
8. Quantum Computing with Trapped Charged Particles.
Título da Série: Springer series on atomic, optical, and plasma physics, 54.
Responsabilidade: G. Werth, V.N. Gheorghe, F.G. Major.
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Resumo:

Here is the second volume of this publication, devoted to the applications of this technology, and complementing the first volume's comprehensive treatment of the theory and practice of charged  Ler mais...

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