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Circuit Design for Reliability

Author: Ricardo Reis; Yu Cao; Gilson Wirth
Publisher: New York, NY : Springer, 2015.
Series: SpringerLink : Bücher
Edition/Format:   eBook : EnglishView all editions and formats
Database:WorldCat
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Material Type: Internet resource
Document Type: Internet Resource
All Authors / Contributors: Ricardo Reis; Yu Cao; Gilson Wirth
ISBN: 9781461440789 1461440785
OCLC Number: 899607648
Description: Online-Ressource (VI, 272 p. 190 illus., 132 illus. in color, online resource)
Contents: Introduction --
Recent Trends in Bias Temperature Instability --
Charge trapping phenomena in MOSFETS: From Noise to Bias Temperature Instability --
Atomistic Simulations on Reliability --
On-chip characterization of statistical device degradation --
Circuit Resilience Roadmap --
Layout Aware Electromigration Analysis of Power/Ground Networks --
Power-Gating for Leakage Control and Beyond --
Soft Error Rate and Fault Tolerance Techniques for FPGAs.
Series Title: SpringerLink : Bücher
Responsibility: edited by Ricardo Reis, Yu Cao, Gilson Wirth.

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