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CMOS RF modeling, characterization and applications

Author: M Jamal Deen; Tor A Fjeldly
Publisher: River Edge, N.J. : World Scientific, ©2002.
Series: Selected topics in electronics and systems, v. 24.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:

CMOS technology is becoming a serious contender for radio frequency (RF) applications in the GHz range. This text discusses many of the challenges facing the CMOS RF circuit designer in terms of  Read more...

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Genre/Form: Electronic books
Additional Physical Format: Print version:
CMOS RF modeling, characterization and applications.
River Edge, NJ : World Scientific, ©2002
(DLC) 2002283685
(OCoLC)50025753
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: M Jamal Deen; Tor A Fjeldly
ISBN: 9812777768 9789812777768
OCLC Number: 560447067
Description: 1 online resource (xi, 409 pages) : illustrations.
Contents: RF MOS measurements, F. Sischka and T. Gneiting; MOSFET modelling and parameter extraction for RF IC's, M. Je et al; MOSFET modelling for RF IC design, Y. Cheng; RF CMOS noise characterization and modelling, C.-H. Chen and M.J. Deen; SOI CMOS transistors for RF and microwave applications, D. Flandre et al; RF CMOS reliability, S. Naseh and M.J. Deen.
Series Title: Selected topics in electronics and systems, v. 24.
Responsibility: editors, M. Jamal Deen, Tor A. Fjeldly.

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