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Combined analysis

Author: Daniel Chateigner
Publisher: London, UK : ISTE ; Hoboken, NJ : Wiley, 2010.
Edition/Format:   Print book : EnglishView all editions and formats
Database:WorldCat
Summary:
This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analysis in a single approach.
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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Daniel Chateigner
ISBN: 9781848211988 1848211988
OCLC Number: 500823573
Description: xviii, 497 pages : illustrations ; 24 cm
Contents: Some basic notions about powder diffraction --
Structure refinement by diffraction profile adjustment (Rietveld method) --
Automatic indexing of powder diagrams --
Quantitative texture analysis --
Quantitative microstructure analysis --
Quantitative phase analysis --
Residual strain-stress analysis --
X-ray reflectivity --
Combined structure-texture-microstructure-stress-phase reflectivity analysis --
Macroscopic anisotropic properties.
Responsibility: Daniel Chateigner.
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Abstract:

This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or  Read more...

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Primary Entity

<http://www.worldcat.org/oclc/500823573> # Combined analysis
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "500823573" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/enk> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/374126169#Place/london_uk> ; # London, UK
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/374126169#Place/hoboken_nj> ; # Hoboken, NJ
    schema:about <http://experiment.worldcat.org/entity/work/data/374126169#Topic/kristallstrukturanalyse> ; # Kristallstrukturanalyse
    schema:about <http://id.worldcat.org/fast/853459> ; # Chemistry, Analytic
    schema:about <http://dewey.info/class/548.83/e22/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/374126169#Topic/analytische_chemie> ; # Analytische Chemie
    schema:about <http://id.worldcat.org/fast/1125442> ; # Solid state chemistry
    schema:about <http://id.worldcat.org/fast/884667> ; # Crystals
    schema:about <http://experiment.worldcat.org/entity/work/data/374126169#Topic/festkorper> ; # Festkörper
    schema:bookFormat bgn:PrintBook ;
    schema:creator <http://viaf.org/viaf/120450433> ; # Daniel Chateigner
    schema:datePublished "2010" ;
    schema:description "This book shows that the existence of texture in a specimen can be envisaged as a way to decouple ordinarily strongly correlated parameters, as measured for instance in powder diagrams, and to examine and detail deeper material characterizations in a single methodology. --Book Jacket."@en ;
    schema:description "This book introduces and details the key facets of Combined Analysis - an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analysis in a single approach."@en ;
    schema:description "Some basic notions about powder diffraction -- Structure refinement by diffraction profile adjustment (Rietveld method) -- Automatic indexing of powder diagrams -- Quantitative texture analysis -- Quantitative microstructure analysis -- Quantitative phase analysis -- Residual strain-stress analysis -- X-ray reflectivity -- Combined structure-texture-microstructure-stress-phase reflectivity analysis -- Macroscopic anisotropic properties."@en ;
    schema:description "Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. Finally, the book introduces the combined analysis concept, showing how it is superior to the view presented when we look at only one part of the analyses."@en ;
    schema:description "The author starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Powder diffraction data treatment is introduced and in particular, the Rietveld analysis is discussed. The book also addresses automatic phase indexing - a necessary step to solve a structure ab initio. Since its effect prevails on real samples where textures are often stabilized, quantitative texture analysis is also detailed."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/374126169> ;
    schema:inLanguage "en" ;
    schema:name "Combined analysis"@en ;
    schema:productID "500823573" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/500823573#PublicationEvent/london_uk_iste_hoboken_nj_wiley_2010> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/374126169#Agent/iste> ; # ISTE
    schema:publisher <http://experiment.worldcat.org/entity/work/data/374126169#Agent/wiley> ; # Wiley
    schema:url <http://catdir.loc.gov/catdir/enhancements/fy1402/2010012973-t.html> ;
    schema:workExample <http://worldcat.org/isbn/9781848211988> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/500823573> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/374126169#Topic/analytische_chemie> # Analytische Chemie
    a schema:Intangible ;
    schema:name "Analytische Chemie"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/374126169#Topic/kristallstrukturanalyse> # Kristallstrukturanalyse
    a schema:Intangible ;
    schema:name "Kristallstrukturanalyse"@en ;
    .

<http://id.worldcat.org/fast/1125442> # Solid state chemistry
    a schema:Intangible ;
    schema:name "Solid state chemistry"@en ;
    .

<http://id.worldcat.org/fast/853459> # Chemistry, Analytic
    a schema:Intangible ;
    schema:name "Chemistry, Analytic"@en ;
    .

<http://id.worldcat.org/fast/884667> # Crystals
    a schema:Intangible ;
    schema:name "Crystals"@en ;
    .

<http://viaf.org/viaf/120450433> # Daniel Chateigner
    a schema:Person ;
    schema:familyName "Chateigner" ;
    schema:givenName "Daniel" ;
    schema:name "Daniel Chateigner" ;
    .

<http://worldcat.org/isbn/9781848211988>
    a schema:ProductModel ;
    schema:isbn "1848211988" ;
    schema:isbn "9781848211988" ;
    .


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