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Computer-assisted microscopy : the measurement and analysis of images

Author: John C Russ
Publisher: New York : Plenum Press, ©1990.
Edition/Format:   Print book : EnglishView all editions and formats
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Additional Physical Format: Online version:
Russ, John C.
Computer-assisted microscopy.
New York : Plenum Press, ©1990
(OCoLC)903884688
Document Type: Book
All Authors / Contributors: John C Russ
ISBN: 0306434105 9780306434105
OCLC Number: 20758992
Description: xii, 453 pages : illustrations ; 26 cm
Contents: 1 Introduction.- The importance of images.- Why measure images?.- Computer methods: an overview.- Implementation.- Acquisition and processing of images.- Measurements within images.- More than two dimensions.- 2 Acquiring Images.- Image sources.- Multi-spectral images.- Image sensors.- Digitization.- Specifications.- References.- 3 Image Processing.- Point operations.- Time sequences.- Correcting image defects - averaging to reduce noise.- Reducing noise in a single image.- Frequency space.- Color images.- Shading correction.- Fitting backgrounds.- Rubber sheeting.- Image sharpening.- Focussing images.- References.- 4 Segmentation of Edges and Lines.- Defining a feature and its boundary.- Roberts' cross edge operator.- The Sobel and Kirsch operators.- Other edge-finding methods.- Other segmentation methods.- The Hough transform.- Touching features.- Manual outlining.- References.- 5 Discrimination and Thresholding.- Brightness thresholds.- Thresholding after processing.- Selecting threshold settings.- The need for automatic thresholding.- Automatic methods.- Histogram minimum method.- Minimum area sensitivity method 1ll.- Minimum perimeter sensitivity method.- Reproducibility testing.- Fixed percentage setting.- Color images.- Encoding binary images.- Contiguity.- References.- 6 Binary Image Editing.- Manual editing.- Combining images.- Neighbor operations.- Skeletonization.- Measurement using binary image editing.- Covariance.- Watershed segmentation.- Mosaic amalgamation and fractal dimensions.- Contiguity and filling interior holes.- References.- 7 Image Measurements.- Reference areas.- Boundary curvature.- Feature measurements.- Perimeter points.- Length and breadth.- Radius of curvature.- Image processing approaches.- Counting neighbor patterns.- Shape.- Corners as a measure of shape.- Harmonic analysis.- Position.- Neighbor relationships.- Edge effects.- Brightness.- References.- 8 Stereological Interpretation of Measurement Data.- Global measurements.- Global parameters.- Mean free path.- Problems in 3-D interpretation.- Feature specific measurements.- Distribution histograms of size.- Interpreting distributions.- Nonparametric tests.- Cumulative plots.- Plotting shape and position data.- Other plots.- References.- 9 Object Recognition.- Locating features.- Parametric object description.- Distinguishing populations.- Decision points.- Other identification methods.- An example.- Comparing multiple populations.- An example of contextual learning.- Other applications.- Artificial intelligence.- References.- 10 Surface Image Measurements.- Depth cues.- Image contrast.- Shape from texture.- The scanning electron microscope.- Line width measurement.- Roughness and fractal dimensions.- Other surface measurement methods.- References.- 11 Stereoscopy.- Principles from human vision.- Measurement of elevation from parallax.- Presentation of the data.- Automatic fusion.- Stereoscopy in transparent volumes.- References.- 12 Serial Sections.- Obtaining serial section images.- Optical sectioning.- Presentation of 3-D image information.- Aligning slices.- Displays of outline images.- Surface modelling.- Measurements on surface-modelled objects.- Voxel displays.- Measurements on voxel images.- Network analysis.- Connectivity.- References.- 13 Tomography.- Reconstruction.- Instrumentation.- 3-D Imaging.- References.- 14 Lessons from Human Vision.- The language of structure.- Illusion.- Conclusion.- References.- For further reading.
Responsibility: John C. Russ.

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Primary Entity

<http://www.worldcat.org/oclc/20758992> # Computer-assisted microscopy : the measurement and analysis of images
    a schema:CreativeWork, schema:Book ;
    library:oclcnum "20758992" ;
    library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/beeldverwerking> ; # Beeldverwerking
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/digitale_technieken> ; # Digitale technieken
    schema:about <http://id.worldcat.org/fast/967501> ; # Image processing
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/computer> ; # Computer
    schema:about <http://id.worldcat.org/fast/1046784> ; # Optical pattern recognition
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/microscopy_data_processing> ; # Microscopy--Data processing
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/microscopie_informatique> ; # Microscopie--Informatique
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/reconnaissance_optique_des_formes_informatique> ; # Reconnaissance optique des formes (Informatique)
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/datenverarbeitung> ; # Datenverarbeitung
    schema:about <http://dewey.info/class/502.820285/e20/> ;
    schema:about <http://id.worldcat.org/fast/1020063> ; # Microscopy--Data processing
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/microscopy> ; # Microscopy
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/microscope_and_microscopy_data_processing> ; # Microscope and microscopy - Data processing
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/mikroskopie> ; # Mikroskopie
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/microscopie> ; # Microscopie
    schema:about <http://experiment.worldcat.org/entity/work/data/836759018#Topic/traitement_d_images> ; # Traitement d'images
    schema:bookFormat bgn:PrintBook ;
    schema:copyrightYear "1990" ;
    schema:creator <http://viaf.org/viaf/1916425> ; # John C. Russ
    schema:datePublished "1990" ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/836759018> ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/903884688> ;
    schema:name "Computer-assisted microscopy : the measurement and analysis of images"@en ;
    schema:productID "20758992" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/20758992#PublicationEvent/new_york_plenum_press_1990> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/836759018#Agent/plenum_press> ; # Plenum Press
    schema:workExample <http://worldcat.org/isbn/9780306434105> ;
    umbel:isLike <http://bnb.data.bl.uk/id/resource/GB9149480> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/20758992> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
    schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/836759018#Agent/plenum_press> # Plenum Press
    a bgn:Agent ;
    schema:name "Plenum Press" ;
    .

<http://experiment.worldcat.org/entity/work/data/836759018#Topic/datenverarbeitung> # Datenverarbeitung
    a schema:Intangible ;
    schema:name "Datenverarbeitung"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/836759018#Topic/digitale_technieken> # Digitale technieken
    a schema:Intangible ;
    schema:name "Digitale technieken"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/836759018#Topic/microscope_and_microscopy_data_processing> # Microscope and microscopy - Data processing
    a schema:Intangible ;
    schema:name "Microscope and microscopy - Data processing"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/836759018#Topic/microscopie_informatique> # Microscopie--Informatique
    a schema:Intangible ;
    schema:name "Microscopie--Informatique"@en ;
    schema:name "Microscopie--Informatique"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/836759018#Topic/reconnaissance_optique_des_formes_informatique> # Reconnaissance optique des formes (Informatique)
    a schema:Intangible ;
    schema:name "Reconnaissance optique des formes (Informatique)"@en ;
    schema:name "Reconnaissance optique des formes (Informatique)"@fr ;
    .

<http://experiment.worldcat.org/entity/work/data/836759018#Topic/traitement_d_images> # Traitement d'images
    a schema:Intangible ;
    schema:name "Traitement d'images"@en ;
    schema:name "Traitement d'images"@fr ;
    .

<http://id.worldcat.org/fast/1020063> # Microscopy--Data processing
    a schema:Intangible ;
    schema:name "Microscopy--Data processing"@en ;
    .

<http://id.worldcat.org/fast/1046784> # Optical pattern recognition
    a schema:Intangible ;
    schema:name "Optical pattern recognition"@en ;
    .

<http://id.worldcat.org/fast/967501> # Image processing
    a schema:Intangible ;
    schema:name "Image processing"@en ;
    .

<http://viaf.org/viaf/1916425> # John C. Russ
    a schema:Person ;
    schema:familyName "Russ" ;
    schema:givenName "John C." ;
    schema:name "John C. Russ" ;
    .

<http://worldcat.org/isbn/9780306434105>
    a schema:ProductModel ;
    schema:isbn "0306434105" ;
    schema:isbn "9780306434105" ;
    .

<http://www.worldcat.org/oclc/903884688>
    a schema:CreativeWork ;
    rdfs:label "Computer-assisted microscopy." ;
    schema:description "Online version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/20758992> ; # Computer-assisted microscopy : the measurement and analysis of images
    .


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