skip to content
Computer-Assisted Microscopy : the Measurement and Analysis of Images Preview this item
ClosePreview this item
Checking...

Computer-Assisted Microscopy : the Measurement and Analysis of Images

Author: John C Russ
Publisher: Boston, MA : Springer US, 1990.
Edition/Format:   eBook : Bibliographic data : EnglishView all editions and formats
Summary:

The use of computer-based image analysis systems for all kinds of images, but especially for microscope images, has become increasingly widespread in recent years, as computer power has increased and  Read more...

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Electronic books
Additional Physical Format: Printed edition:
Material Type: Bibliographic data, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: John C Russ
ISBN: 9781461305637 1461305632 9781461278689 1461278686
OCLC Number: 840281004
Description: 1 online resource (470 pages)
Contents: 1 Introduction --
The importance of images --
Why measure images? --
Computer methods: an overview --
Implementation --
Acquisition and processing of images --
Measurements within images --
More than two dimensions --
2 Acquiring Images --
Image sources --
Multi-spectral images --
Image sensors --
Digitization --
Specifications --
References --
3 Image Processing --
Point operations --
Time sequences --
Correcting image defects --
averaging to reduce noise --
Reducing noise in a single image --
Frequency space --
Color images --
Shading correction --
Fitting backgrounds --
Rubber sheeting --
Image sharpening --
Focussing images --
References --
4 Segmentation of Edges and Lines --
Defining a feature and its boundary --
Roberts' cross edge operator --
The Sobel and Kirsch operators --
Other edge-finding methods --
Other segmentation methods --
The Hough transform --
Touching features --
Manual outlining --
References --
5 Discrimination and Thresholding --
Brightness thresholds --
Thresholding after processing --
Selecting threshold settings --
The need for automatic thresholding --
Automatic methods --
Histogram minimum method --
Minimum area sensitivity method 1ll --
Minimum perimeter sensitivity method --
Reproducibility testing --
Fixed percentage setting --
Color images --
Encoding binary images --
Contiguity --
References --
6 Binary Image Editing --
Manual editing --
Combining images --
Neighbor operations --
Skeletonization --
Measurement using binary image editing --
Covariance --
Watershed segmentation --
Mosaic amalgamation and fractal dimensions --
Contiguity and filling interior holes --
References --
7 Image Measurements --
Reference areas --
Boundary curvature --
Feature measurements --
Perimeter points --
Length and breadth --
Radius of curvature --
Image processing approaches --
Counting neighbor patterns --
Shape --
Corners as a measure of shape --
Harmonic analysis --
Position --
Neighbor relationships --
Edge effects --
Brightness --
References --
8 Stereological Interpretation of Measurement Data --
Global measurements --
Global parameters --
Mean free path --
Problems in 3-D interpretation --
Feature specific measurements --
Distribution histograms of size --
Interpreting distributions --
Nonparametric tests --
Cumulative plots --
Plotting shape and position data --
Other plots --
References --
9 Object Recognition --
Locating features --
Parametric object description --
Distinguishing populations --
Decision points --
Other identification methods --
An example --
Comparing multiple populations --
An example of contextual learning --
Other applications --
Artificial intelligence --
References --
10 Surface Image Measurements --
Depth cues --
Image contrast --
Shape from texture --
The scanning electron microscope --
Line width measurement --
Roughness and fractal dimensions --
Other surface measurement methods --
References --
11 Stereoscopy --
Principles from human vision --
Measurement of elevation from parallax --
Presentation of the data --
Automatic fusion --
Stereoscopy in transparent volumes --
References --
12 Serial Sections --
Obtaining serial section images --
Optical sectioning --
Presentation of 3-D image information --
Aligning slices --
Displays of outline images --
Surface modelling --
Measurements on surface-modelled objects --
Voxel displays --
Measurements on voxel images --
Network analysis --
Connectivity --
References --
13 Tomography --
Reconstruction --
Instrumentation --
3-D Imaging --
References --
14 Lessons from Human Vision --
The language of structure --
Illusion --
Conclusion --
References --
For further reading.
Responsibility: by John C. Russ.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/840281004> # Computer-Assisted Microscopy : the Measurement and Analysis of Images
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "840281004" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/836759018#Place/boston_ma> ; # Boston, MA
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/mau> ;
   rdfs:comment "Unknown 'gen' value: bdt" ;
   schema:about <http://id.worldcat.org/fast/1020062> ; # Microscopy
   schema:about <http://id.worldcat.org/fast/1026460> ; # Morphology (Animals)
   schema:about <http://id.worldcat.org/fast/998323> ; # Life sciences
   schema:about <http://id.worldcat.org/fast/1139265> ; # Surfaces (Physics)
   schema:about <http://dewey.info/class/570.282/e23/> ;
   schema:about <http://id.worldcat.org/fast/836869> ; # Botany
   schema:bookFormat schema:EBook ;
   schema:creator <http://viaf.org/viaf/1916425> ; # John C. Russ
   schema:datePublished "1990" ;
   schema:description "1 Introduction -- The importance of images -- Why measure images? -- Computer methods: an overview -- Implementation -- Acquisition and processing of images -- Measurements within images -- More than two dimensions -- 2 Acquiring Images -- Image sources -- Multi-spectral images -- Image sensors -- Digitization -- Specifications -- References -- 3 Image Processing -- Point operations -- Time sequences -- Correcting image defects -- averaging to reduce noise -- Reducing noise in a single image -- Frequency space -- Color images -- Shading correction -- Fitting backgrounds -- Rubber sheeting -- Image sharpening -- Focussing images -- References -- 4 Segmentation of Edges and Lines -- Defining a feature and its boundary -- Roberts' cross edge operator -- The Sobel and Kirsch operators -- Other edge-finding methods -- Other segmentation methods -- The Hough transform -- Touching features -- Manual outlining -- References -- 5 Discrimination and Thresholding -- Brightness thresholds -- Thresholding after processing -- Selecting threshold settings -- The need for automatic thresholding -- Automatic methods -- Histogram minimum method -- Minimum area sensitivity method 1ll -- Minimum perimeter sensitivity method -- Reproducibility testing -- Fixed percentage setting -- Color images -- Encoding binary images -- Contiguity -- References -- 6 Binary Image Editing -- Manual editing -- Combining images -- Neighbor operations -- Skeletonization -- Measurement using binary image editing -- Covariance -- Watershed segmentation -- Mosaic amalgamation and fractal dimensions -- Contiguity and filling interior holes -- References -- 7 Image Measurements -- Reference areas -- Boundary curvature -- Feature measurements -- Perimeter points -- Length and breadth -- Radius of curvature -- Image processing approaches -- Counting neighbor patterns -- Shape -- Corners as a measure of shape -- Harmonic analysis -- Position -- Neighbor relationships -- Edge effects -- Brightness -- References -- 8 Stereological Interpretation of Measurement Data -- Global measurements -- Global parameters -- Mean free path -- Problems in 3-D interpretation -- Feature specific measurements -- Distribution histograms of size -- Interpreting distributions -- Nonparametric tests -- Cumulative plots -- Plotting shape and position data -- Other plots -- References -- 9 Object Recognition -- Locating features -- Parametric object description -- Distinguishing populations -- Decision points -- Other identification methods -- An example -- Comparing multiple populations -- An example of contextual learning -- Other applications -- Artificial intelligence -- References -- 10 Surface Image Measurements -- Depth cues -- Image contrast -- Shape from texture -- The scanning electron microscope -- Line width measurement -- Roughness and fractal dimensions -- Other surface measurement methods -- References -- 11 Stereoscopy -- Principles from human vision -- Measurement of elevation from parallax -- Presentation of the data -- Automatic fusion -- Stereoscopy in transparent volumes -- References -- 12 Serial Sections -- Obtaining serial section images -- Optical sectioning -- Presentation of 3-D image information -- Aligning slices -- Displays of outline images -- Surface modelling -- Measurements on surface-modelled objects -- Voxel displays -- Measurements on voxel images -- Network analysis -- Connectivity -- References -- 13 Tomography -- Reconstruction -- Instrumentation -- 3-D Imaging -- References -- 14 Lessons from Human Vision -- The language of structure -- Illusion -- Conclusion -- References -- For further reading."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/836759018> ;
   schema:genre "Electronic books"@en ;
   schema:inLanguage "en" ;
   schema:isSimilarTo <http://worldcat.org/entity/work/data/836759018#CreativeWork/> ;
   schema:name "Computer-Assisted Microscopy : the Measurement and Analysis of Images"@en ;
   schema:productID "840281004" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/840281004#PublicationEvent/boston_ma_springer_us_1990> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/836759018#Agent/springer_us> ; # Springer US
   schema:url <http://dx.doi.org/10.1007/978-1-4613-0563-7> ;
   schema:url <http://link.springer.com/10.1007/978-1-4613-0563-7> ;
   schema:workExample <http://worldcat.org/isbn/9781461278689> ;
   schema:workExample <http://dx.doi.org/10.1007/978-1-4613-0563-7> ;
   schema:workExample <http://worldcat.org/isbn/9781461305637> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/840281004> ;
    .


Related Entities

<http://id.worldcat.org/fast/1020062> # Microscopy
    a schema:Intangible ;
   schema:name "Microscopy"@en ;
    .

<http://id.worldcat.org/fast/1026460> # Morphology (Animals)
    a schema:Intangible ;
   schema:name "Morphology (Animals)"@en ;
    .

<http://id.worldcat.org/fast/1139265> # Surfaces (Physics)
    a schema:Intangible ;
   schema:name "Surfaces (Physics)"@en ;
    .

<http://id.worldcat.org/fast/836869> # Botany
    a schema:Intangible ;
   schema:name "Botany"@en ;
    .

<http://id.worldcat.org/fast/998323> # Life sciences
    a schema:Intangible ;
   schema:name "Life sciences"@en ;
    .

<http://link.springer.com/10.1007/978-1-4613-0563-7>
   rdfs:comment "from Springer" ;
   rdfs:comment "(Unlimited Concurrent Users)" ;
    .

<http://viaf.org/viaf/1916425> # John C. Russ
    a schema:Person ;
   schema:familyName "Russ" ;
   schema:givenName "John C." ;
   schema:name "John C. Russ" ;
    .

<http://worldcat.org/entity/work/data/836759018#CreativeWork/>
    a schema:CreativeWork ;
   schema:description "Printed edition:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/840281004> ; # Computer-Assisted Microscopy : the Measurement and Analysis of Images
    .

<http://worldcat.org/isbn/9781461278689>
    a schema:ProductModel ;
   schema:isbn "1461278686" ;
   schema:isbn "9781461278689" ;
    .

<http://worldcat.org/isbn/9781461305637>
    a schema:ProductModel ;
   schema:isbn "1461305632" ;
   schema:isbn "9781461305637" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.