skip to content
Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979 Preview this item
ClosePreview this item
Checking...

Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979

Author: Institution of Electrical Engineers.
Publisher: London ; New York : Institution of Electrical Engineers, ©1979.
Series: IEE conference publication, no. 174.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Conference on Electronic Test and Measuring Instrumentation--Testmex (1979 : Wembley, England).
Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979.
London ; New York : Institution of Electrical Engineers, ©1979
(OCoLC)715548915
Material Type: Conference publication
Document Type: Book
All Authors / Contributors: Institution of Electrical Engineers.
ISBN: 0852962045 9780852962046
OCLC Number: 5350328
Notes: Cover and spine title: Electronic test and measuring instrumentation--Testmex 79.
Description: vii, 157 pages : illustrations ; 30 cm.
Series Title: IEE conference publication, no. 174.
Other Titles: Electronic test and measuring instrumentation--Testmex 79.
Responsibility: organised by the Institution of Electrical Engineers, in association with the Institute of Electrical and Electronics Engineers (United Kingdom and Republic of Ireland Section) [and others].

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/5350328> # Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979
    a schema:CreativeWork, schema:Book ;
   library:oclcnum "5350328" ;
   library:placeOfPublication <http://dbpedia.org/resource/London> ; # London
   library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/enk> ;
   rdfs:seeAlso <http://experiment.worldcat.org/entity/work/data/17049344#CreativeWork/electronic_test_and_measuring_instrumentation_testmex_79> ; # Electronic test and measuring instrumentation--Testmex 79.
   schema:about <http://dewey.info/class/621.381548/e18/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/17049344#Topic/electronic_instruments> ; # Electronic instruments
   schema:about <http://experiment.worldcat.org/entity/work/data/17049344#Thing/electronic_measuring_instruments_&_electronic_testing_equipment> ; # Electronic measuring instruments & electronic testing equipment.
   schema:about <http://id.worldcat.org/fast/907299> ; # Electronic instruments
   schema:bookFormat bgn:PrintBook ;
   schema:contributor <http://viaf.org/viaf/137135158> ; # Institution of Electrical Engineers.
   schema:copyrightYear "1979" ;
   schema:creator <http://experiment.worldcat.org/entity/work/data/17049344#Meeting/conference_on_electronic_test_and_measuring_instrumentation_testmex_1979_wembley_england> ; # Conference on Electronic Test and Measuring Instrumentation--Testmex (1979 : Wembley, England)
   schema:datePublished "1979" ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/17049344> ;
   schema:genre "Conference papers and proceedings"@en ;
   schema:genre "Congresses"@en ;
   schema:genre "Conference publication"@en ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/17049344#Series/iee_conference_publication> ; # IEE conference publication ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/715548915> ;
   schema:name "Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979"@en ;
   schema:productID "5350328" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/5350328#PublicationEvent/london_new_york_institution_of_electrical_engineers_1979> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/17049344#Agent/institution_of_electrical_engineers> ; # Institution of Electrical Engineers
   schema:workExample <http://worldcat.org/isbn/9780852962046> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/5350328> ;
    .


Related Entities

<http://dbpedia.org/resource/London> # London
    a schema:Place ;
   schema:name "London" ;
    .

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
   schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/17049344#Agent/institution_of_electrical_engineers> # Institution of Electrical Engineers
    a bgn:Agent ;
   schema:name "Institution of Electrical Engineers" ;
    .

<http://experiment.worldcat.org/entity/work/data/17049344#CreativeWork/electronic_test_and_measuring_instrumentation_testmex_79> # Electronic test and measuring instrumentation--Testmex 79.
    a schema:CreativeWork ;
   schema:name "Electronic test and measuring instrumentation--Testmex 79." ;
    .

<http://experiment.worldcat.org/entity/work/data/17049344#Meeting/conference_on_electronic_test_and_measuring_instrumentation_testmex_1979_wembley_england> # Conference on Electronic Test and Measuring Instrumentation--Testmex (1979 : Wembley, England)
    a bgn:Meeting, schema:Event ;
   schema:location <http://experiment.worldcat.org/entity/work/data/17049344#Place/wembley_england> ; # Wembley, England)
   schema:name "Conference on Electronic Test and Measuring Instrumentation--Testmex (1979 : Wembley, England)" ;
    .

<http://experiment.worldcat.org/entity/work/data/17049344#Place/wembley_england> # Wembley, England)
    a schema:Place ;
   schema:name "Wembley, England)" ;
    .

<http://experiment.worldcat.org/entity/work/data/17049344#Series/iee_conference_publication> # IEE conference publication ;
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/5350328> ; # Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979
   schema:name "IEE conference publication ;" ;
    .

<http://experiment.worldcat.org/entity/work/data/17049344#Thing/electronic_measuring_instruments_&_electronic_testing_equipment> # Electronic measuring instruments & electronic testing equipment.
    a schema:Thing ;
   schema:name "Electronic measuring instruments & electronic testing equipment." ;
    .

<http://id.worldcat.org/fast/907299> # Electronic instruments
    a schema:Intangible ;
   schema:name "Electronic instruments"@en ;
    .

<http://viaf.org/viaf/137135158> # Institution of Electrical Engineers.
    a schema:Organization ;
   schema:name "Institution of Electrical Engineers." ;
    .

<http://worldcat.org/isbn/9780852962046>
    a schema:ProductModel ;
   schema:isbn "0852962045" ;
   schema:isbn "9780852962046" ;
    .

<http://www.worldcat.org/oclc/715548915>
    a schema:CreativeWork ;
   rdfs:label "Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/5350328> ; # Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979
    .

<http://www.worldcat.org/title/-/oclc/5350328>
    a genont:InformationResource, genont:ContentTypeGenericResource ;
   schema:about <http://www.worldcat.org/oclc/5350328> ; # Conference on Electronic Test and Measuring Instrumentation--Testmex 79, 19-21 June, 1979
   schema:dateModified "2018-03-11" ;
   void:inDataset <http://purl.oclc.org/dataset/WorldCat> ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.