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Conference record : Autotestcon '89, "The systems readiness technology conference," September 25-28, 1989, IEEE International Automatic Testing Conference, Adams Mark Hotel, City Line Avenue, Philadelphia, Pennsylvania : automatic testing in the next decade & 21st century

Author: Institute of Electrical and Electronics Engineers.
Publisher: New York, NY : IEEE ; Piscataway, NJ : Additional copies may be ordered from IEEE, ©1989.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
Database:WorldCat
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: Institute of Electrical and Electronics Engineers.
OCLC Number: 21148979
Notes: "89CH2568-4."
Description: 357 pages : illustrations ; 28 cm
Other Titles: Autotestcon '89
Systems readiness technology conference
Automatic testing in the next decade & 21st century
Responsibility: sponsored by the Institute of Electrical and Electronics Engineers [and others] ; participating societies, American Institute of Aeronautics and Astronautics, AIAA Support Systems Technical Committee.

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