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Contactless VLSI Measurement and Testing Techniques.

Author: Selahattin Sayil
Publisher: Cham : Springer, 2017.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:

The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing  Read more...

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Genre/Form: Electronic books
Additional Physical Format: Print version:
Sayil, Selahattin.
Contactless VLSI Measurement and Testing Techniques.
Cham : Springer International Publishing, ©2017
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Selahattin Sayil
ISBN: 9783319696737 3319696734
OCLC Number: 1012882401
Description: 1 online resource (92 pages)
Contents: 1. Conventional Test Methods. - 2. Testability Design.- 3. Other Techniques Based on the Contacting Probe.- 4. Contactless Testing.- 5. Electron-Beam and Photoemission Probing.- 6. Electro Optic Sampling and Charge Density Probe.- 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe.- 8. Probing Techniques Based on Light Emission from Chip.- 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits.- 10. Comparison of Contactless Testing Methodologies.

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