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Contactless VLSI measurement and testing techniques

Author: Selahattin Sayil
Publisher: Cham : Springer, [2018]
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing. The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing might resolve many of the challenges  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Print version:
Sayil, Selahattin.
Contactless VLSI Measurement and Testing Techniques.
Cham : Springer International Publishing, ©2017
(OCoLC)1026801820
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Selahattin Sayil
ISBN: 9783319696737 3319696734
OCLC Number: 1012882401
Description: 1 online resource (92 pages)
Contents: 1. Conventional Test Methods. - 2. Testability Design --
3. Other Techniques Based on the Contacting Probe --
4. Contactless Testing --
5. Electron-Beam and Photoemission Probing --
6. Electro Optic Sampling and Charge Density Probe --
7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe --
8. Probing Techniques Based on Light Emission from Chip --
9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits --
10. Comparison of Contactless Testing Methodologies.
Responsibility: Selahattin Sayil.

Abstract:

The author highlights the inherent difficulties encountered with the mechanical probe and testability design approaches for functional and internal fault testing and shows how contactless testing  Read more...

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