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Damage to VUV, EUV, and X-ray optics V : 15-16 April 2015, Prague, Czech Republic

Author: Libor Juha; Saša Bajt; Richard A London; SPIE (Society),
Publisher: Bellingham, Washington : SPIE, [2015] ©2015
Series: Proceedings of SPIE--the International Society for Optical Engineering, v. 9511.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:

Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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Genre/Form: Electronic books
Congresses
Additional Physical Format: Print version:
(OCoLC)921979646
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Libor Juha; Saša Bajt; Richard A London; SPIE (Society),
ISBN: 9781628416329 1628416327
OCLC Number: 923762545
Description: 1 online resource : illustrations (some color).
Series Title: Proceedings of SPIE--the International Society for Optical Engineering, v. 9511.
Responsibility: Libor Juha, Saša Bajt, Richard London, editors ; sponsored by SPIE ; cooperating organizations, HiPER Project (United Kingdom), ELI Beamlines (Czech Republic), Laserlab Europe ; published by SPIE.

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