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  E-mail Message: I thought you might be interested in this item at http://www.worldcat.org/oclc/76869285 Title: Data mining and diagnosing IC fails Author: Leendert M Huisman Publisher: New York : Springer, 2005. ISBN/ISSN: 0387249931 9780387249933 9780387263519 0387263519 9786610613502 6610613508 OCLC:76869285

  
  

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Subjects

• Integrated circuits -- Testing -- Statistical methods.
• Semiconductors -- Failures.
• Data mining.
• View all subjects

Similar Items

Data mining and diagnosing IC fails

Author:	Leendert M Huisman
Publisher:	New York : Springer, 2005.
Series:	Frontiers in electronic testing.
Edition/Format:	eBook : Document : EnglishView all editions and formats
Summary:	"The purpose of the book is to bring together in one place a large number of analysis, data mining and diagnosis techniques that have proven to be useful in analyzing IC fails. The descriptions of the techniques and analysis routines is sufficiently detailed that profession manufacturing engineers can implement them in their own work environment."--Jacket.
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