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Data model patterns : a metadata map

Author: David C Hay
Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann, ©2006.
Series: Morgan Kaufmann series in data management systems.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

Based on the Zachman Framework for information architecture, this work provides a description of the model and is organized so that different readers can benefit from different parts. It offers a  Read more...

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Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: David C Hay
ISBN: 0120887983 9780120887989
OCLC Number: 65538336
Description: xx, 406 pages : illustrations ; 25 cm.
Contents: About metadata models --
Data --
Activities, functions, and processes --
Locations --
People and organizations --
Events and timing --
Motivation.
Series Title: Morgan Kaufmann series in data management systems.
Responsibility: David C. Hay.
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"A very ambitious undertaking, masterfully described. To the best of my knowledge, this is the first published version of the detailed models implied by the Zachman Framework. David Hay builds the Read more...

 
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