skip to content
Debug automation from pre-silicon to post-silicon Preview this item
ClosePreview this item
Checking...

Debug automation from pre-silicon to post-silicon

Author: Mahdī Dihbāshī; Görschwin Fey
Publisher: Cham : Springer, [2014] ©2015
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques  Read more...
Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

 

Find a copy online

Links to this item

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Genre/Form: Electronic books
Additional Physical Format: Print version:
Dehbashi, Mehdi.
Debug Automation from Pre-Silicon to Post-Silicon.
Cham : Springer International Publishing, ©2014
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Mahdī Dihbāshī; Görschwin Fey
ISBN: 9783319093093 3319093096
OCLC Number: 892484660
Description: 1 online resource (xiv, 171 pages) : illustrations (some color)
Contents: Introduction --
Preliminaries --
Part I Debug of Design Bugs --
Automated Debugging for Logic Bugs --
Automated Debugging from Pre-Silicon to Post-Silicon --
Automated Debugging for Synchronization Bugs --
Part II Debug of Delay Faults --
Analyzing Timing Variations --
Automated Debugging for Timing Variations --
Efficient Automated Speedpath Debugging --
Part III Debug of Transactions --
Online Debug for NoC-Based Multiprocessor SoCs --
Summary and Outlook.
Responsibility: Mehdi Dehbashi, Görschwin Fey.

Abstract:

This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/892484660> # Debug automation from pre-silicon to post-silicon
    a schema:MediaObject, schema:Book, schema:CreativeWork ;
    library:oclcnum "892484660" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/sz> ;
    schema:about <http://dewey.info/class/621.395/e23/> ;
    schema:about <http://experiment.worldcat.org/entity/work/data/2209307113#Topic/technology_&_engineering_mechanical> ; # TECHNOLOGY & ENGINEERING--Mechanical
    schema:about <http://experiment.worldcat.org/entity/work/data/2209307113#Topic/integrated_circuits_very_large_scale_integration_design_and_construction> ; # Integrated circuits--Very large scale integration--Design and construction
    schema:about <http://experiment.worldcat.org/entity/work/data/2209307113#Topic/integrated_circuits_very_large_scale_integration_testing> ; # Integrated circuits--Very large scale integration--Testing
    schema:author <http://experiment.worldcat.org/entity/work/data/2209307113#Person/fey_gorschwin> ; # Görschwin Fey
    schema:author <http://experiment.worldcat.org/entity/work/data/2209307113#Person/dihbashi_mahdi> ; # Mahdī Dihbāshī
    schema:bookFormat schema:EBook ;
    schema:copyrightYear "2015" ;
    schema:datePublished "2014" ;
    schema:description "Introduction -- Preliminaries -- Part I Debug of Design Bugs -- Automated Debugging for Logic Bugs -- Automated Debugging from Pre-Silicon to Post-Silicon -- Automated Debugging for Synchronization Bugs -- Part II Debug of Delay Faults -- Analyzing Timing Variations -- Automated Debugging for Timing Variations -- Efficient Automated Speedpath Debugging -- Part III Debug of Transactions -- Online Debug for NoC-Based Multiprocessor SoCs -- Summary and Outlook."@en ;
    schema:description "This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/2209307113> ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://worldcat.org/entity/work/data/2209307113#CreativeWork/debug_automation_from_pre_silicon_to_post_silicon> ;
    schema:name "Debug automation from pre-silicon to post-silicon"@en ;
    schema:productID "892484660" ;
    schema:url <http://link.springer.com/10.1007/978-3-319-09309-3> ;
    schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=1965453> ;
    schema:url <http://dx.doi.org/10.1007/978-3-319-09309-3> ;
    schema:url <http://link.springer.com/openurl?genre=book&isbn=978-3-319-09308-6> ;
    schema:url <http://www.myilibrary.com?id=766136> ;
    schema:url <https://grinnell.idm.oclc.org/login?url=http://link.springer.com/10.1007/978-3-319-09309-3> ;
    schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=855828> ;
    schema:workExample <http://dx.doi.org/10.1007/978-3-319-09309-3> ;
    schema:workExample <http://worldcat.org/isbn/9783319093093> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/892484660> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/2209307113#Person/dihbashi_mahdi> # Mahdī Dihbāshī
    a schema:Person ;
    schema:familyName "Dihbāshī" ;
    schema:givenName "Mahdī" ;
    schema:name "Mahdī Dihbāshī" ;
    .

<http://experiment.worldcat.org/entity/work/data/2209307113#Person/fey_gorschwin> # Görschwin Fey
    a schema:Person ;
    schema:familyName "Fey" ;
    schema:givenName "Görschwin" ;
    schema:name "Görschwin Fey" ;
    .

<http://experiment.worldcat.org/entity/work/data/2209307113#Topic/integrated_circuits_very_large_scale_integration_design_and_construction> # Integrated circuits--Very large scale integration--Design and construction
    a schema:Intangible ;
    schema:name "Integrated circuits--Very large scale integration--Design and construction"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/2209307113#Topic/integrated_circuits_very_large_scale_integration_testing> # Integrated circuits--Very large scale integration--Testing
    a schema:Intangible ;
    schema:name "Integrated circuits--Very large scale integration--Testing"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/2209307113#Topic/technology_&_engineering_mechanical> # TECHNOLOGY & ENGINEERING--Mechanical
    a schema:Intangible ;
    schema:name "TECHNOLOGY & ENGINEERING--Mechanical"@en ;
    .

<http://worldcat.org/entity/work/data/2209307113#CreativeWork/debug_automation_from_pre_silicon_to_post_silicon>
    a schema:CreativeWork ;
    rdfs:label "Debug Automation from Pre-Silicon to Post-Silicon." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/892484660> ; # Debug automation from pre-silicon to post-silicon
    .

<http://worldcat.org/isbn/9783319093093>
    a schema:ProductModel ;
    schema:isbn "3319093096" ;
    schema:isbn "9783319093093" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.